scholarly journals Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation

2014 ◽  
Vol 20 (S3) ◽  
pp. 154-155 ◽  
Author(s):  
Michael Odlyzko ◽  
K. Andre Mkhoyan
Author(s):  
E. J. Kirkland

In a STEM an electron beam is focused into a small probe on the specimen. This probe is raster scanned across the specimen to form an image from the electrons transmitted through the specimen. The objective lens is positioned before the specimen instead of after the specimen as in a CTEM. Because the probe is focused and scanned before the specimen, accurate annular dark field (ADF) STEM image simulation is more difficult than CTEM simulation. Instead of an incident uniform plane wave, ADF-STEM simulation starts with a probe wavefunction focused at a specified position on the specimen. The wavefunction is then propagated through the specimen one atomic layer (or slice) at a time with Fresnel diffraction between slices using the multislice method. After passing through the specimen the wavefunction is diffracted onto the detector. The ADF signal for one position of the probe is formed by integrating all electrons scattered outside of an inner angle large compared with the objective aperture.


Author(s):  
M. Libera ◽  
J.A. Ott ◽  
K. Siangchaew ◽  
L. Tsung

Channeling occurs when fast electrons follow atomic strings in a crystal where there is a minimum in the potential energy (1). Channeling has a strong effect on high-angle scattering. Deviations in atomic position along a channel due to structural defects or thermal vibrations increase the probability of scattering (2-5). Since there are no extended channels in an amorphous material the question arises: for a given material with constant thickness, will the high-angle scattering be higher from a crystal or a glass?Figure la shows a HAADF STEM image collected using a Philips CM20 FEG TEM/STEM with inner and outer collection angles of 35mrad and lOOmrad. The specimen (6) was a cross section of singlecrystal Si containing: amorphous Si (region A), defective Si containing many stacking faults (B), two coherent Ge layers (CI; C2), and a contamination layer (D). CBED patterns (fig. lb), PEELS spectra, and HAADF signals (fig. lc) were collected at 106K and 300K along the indicated line.


Micron ◽  
2015 ◽  
Vol 74 ◽  
pp. 47-53 ◽  
Author(s):  
D.S. He ◽  
Z.Y. Li ◽  
J. Yuan

2009 ◽  
Vol 109 (9) ◽  
pp. 1203-1209 ◽  
Author(s):  
Takao Morimura ◽  
Masayuki Hasaka

2010 ◽  
Vol 16 (S2) ◽  
pp. 252-253
Author(s):  
BN Patrick ◽  
LF Allard ◽  
Y Shao-Horn ◽  
PJ Ferreira

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


Author(s):  
R. F. Loane ◽  
J. Silcox

Thermal vibrations reduce Bragg scattering, create a thermal diffuse background, and disrupt channeling, all of which may affect the ADF STEM signal. There are claims that thermal vibrations can change the relative contrast of different elements in the ADF STEM image, which is different from the simple Z- contrast interpretation. Evaluating the effects of thermal vibrations may be necessary for correct interpretation of experimental results. We present an investigation of ADF STEM imaging including thermal vibrations based on the frozen phonon model.Thermal vibrations can be included in the multislice calculation with a Monte Carlo technique. Since, the interaction time for 100 keV electrons is ≤ 10-4 atomic vibration periods, the atoms may be considered stationary. The time between successive electrons in the STEM is ≥ 102 vibration periods, so the atomic positions seen by different electrons are uncorrelated. The technique is to offset every atom in the specimen (many slices) by a small random amount perpendicular to the beam before performing a standard multislice calculation. A set of random offsets freezes one phonon configuration into the specimen. The calculation is then repeated and averaged over an ensemble of different configurations.


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