scholarly journals Kinematic HAADF-STEM image simulation of small nanoparticles

Micron ◽  
2015 ◽  
Vol 74 ◽  
pp. 47-53 ◽  
Author(s):  
D.S. He ◽  
Z.Y. Li ◽  
J. Yuan
Keyword(s):  
Image Simulation ◽  
Stem Image ◽  
Small Nanoparticles

Simulation of high-resolution annular dark field STEM images

1995 ◽  
Vol 53 ◽  
pp. 40-41
Author(s):  
E. J. Kirkland
Keyword(s):  
Electron Beam ◽  
Atomic Layer ◽  
Fresnel Diffraction ◽  
Dark Field ◽  
Objective Lens ◽  
Image Simulation ◽  
Small Probe ◽  
Annular Dark Field ◽  
Stem Image ◽  
Uniform Plane

In a STEM an electron beam is focused into a small probe on the specimen. This probe is raster scanned across the specimen to form an image from the electrons transmitted through the specimen. The objective lens is positioned before the specimen instead of after the specimen as in a CTEM. Because the probe is focused and scanned before the specimen, accurate annular dark field (ADF) STEM image simulation is more difficult than CTEM simulation. Instead of an incident uniform plane wave, ADF-STEM simulation starts with a probe wavefunction focused at a specified position on the specimen. The wavefunction is then propagated through the specimen one atomic layer (or slice) at a time with Fresnel diffraction between slices using the multislice method. After passing through the specimen the wavefunction is diffracted onto the detector. The ADF signal for one position of the probe is formed by integrating all electrons scattered outside of an inner angle large compared with the objective aperture.

scholarly journals Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation

2014 ◽  
Vol 20 (S3) ◽  
pp. 154-155 ◽  
Author(s):  
Michael Odlyzko ◽  
K. Andre Mkhoyan
Keyword(s):  
Image Simulation ◽  
Stem Image ◽  
Thermal Vibrations

scholarly journals Bloch-wave-based STEM image simulation with layer-by-layer representation

2009 ◽  
Vol 109 (9) ◽  
pp. 1203-1209 ◽  
Author(s):  
Takao Morimura ◽  
Masayuki Hasaka
Keyword(s):  
Bloch Wave ◽  
Layer By Layer ◽  
Image Simulation ◽  
Stem Image

scholarly journals Aberration-Corrected STEM Image Simulation of Segregation in Pt3Co Nanoparticles for PEM Fuel Cells

2010 ◽  
Vol 16 (S2) ◽  
pp. 252-253
Author(s):  
BN Patrick ◽  
LF Allard ◽  
Y Shao-Horn ◽  
PJ Ferreira
Keyword(s):  
Fuel Cells ◽  
Pem Fuel Cells ◽  
Image Simulation ◽  
Stem Image ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Extended dynamical HAADF STEM image simulation using the Bloch-wave method

2006 ◽  
Vol 62 (4) ◽  
pp. 233-236 ◽  
Author(s):  
Takashi Yamazaki ◽  
Kazuto Watanabe ◽  
Koji Kuramochi ◽  
Iwao Hashimoto
Keyword(s):  
Bloch Wave ◽  
Wave Method ◽  
Image Simulation ◽  
Stem Image
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