scholarly journals STEM image simulation by Bloch-wave method with layer-by-layer representation

2010 ◽  
Vol 59 (S1) ◽  
pp. S23-S28 ◽  
Author(s):  
T. Morimura
Keyword(s):  
Bloch Wave ◽  
Layer By Layer ◽  
Wave Method ◽  
Image Simulation ◽  
Stem Image

scholarly journals Bloch-wave-based STEM image simulation with layer-by-layer representation

2009 ◽  
Vol 109 (9) ◽  
pp. 1203-1209 ◽  
Author(s):  
Takao Morimura ◽  
Masayuki Hasaka
Keyword(s):  
Bloch Wave ◽  
Layer By Layer ◽  
Image Simulation ◽  
Stem Image

Extended dynamical HAADF STEM image simulation using the Bloch-wave method

2006 ◽  
Vol 62 (4) ◽  
pp. 233-236 ◽  
Author(s):  
Takashi Yamazaki ◽  
Kazuto Watanabe ◽  
Koji Kuramochi ◽  
Iwao Hashimoto
Keyword(s):  
Bloch Wave ◽  
Wave Method ◽  
Image Simulation ◽  
Stem Image

Simulation of high-resolution annular dark field STEM images

1995 ◽  
Vol 53 ◽  
pp. 40-41
Author(s):  
E. J. Kirkland
Keyword(s):  
Electron Beam ◽  
Atomic Layer ◽  
Fresnel Diffraction ◽  
Dark Field ◽  
Objective Lens ◽  
Image Simulation ◽  
Small Probe ◽  
Annular Dark Field ◽  
Stem Image ◽  
Uniform Plane

In a STEM an electron beam is focused into a small probe on the specimen. This probe is raster scanned across the specimen to form an image from the electrons transmitted through the specimen. The objective lens is positioned before the specimen instead of after the specimen as in a CTEM. Because the probe is focused and scanned before the specimen, accurate annular dark field (ADF) STEM image simulation is more difficult than CTEM simulation. Instead of an incident uniform plane wave, ADF-STEM simulation starts with a probe wavefunction focused at a specified position on the specimen. The wavefunction is then propagated through the specimen one atomic layer (or slice) at a time with Fresnel diffraction between slices using the multislice method. After passing through the specimen the wavefunction is diffracted onto the detector. The ADF signal for one position of the probe is formed by integrating all electrons scattered outside of an inner angle large compared with the objective aperture.

scholarly journals Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation

2014 ◽  
Vol 20 (S3) ◽  
pp. 154-155 ◽  
Author(s):  
Michael Odlyzko ◽  
K. Andre Mkhoyan
Keyword(s):  
Image Simulation ◽  
Stem Image ◽  
Thermal Vibrations

scholarly journals Kinematic HAADF-STEM image simulation of small nanoparticles

Micron ◽  
2015 ◽  
Vol 74 ◽  
pp. 47-53 ◽  
Author(s):  
D.S. He ◽  
Z.Y. Li ◽  
J. Yuan
Keyword(s):  
Image Simulation ◽  
Stem Image ◽  
Small Nanoparticles

Mechanical Properties of the Idealized Inverse-Opal Lattice

2018 ◽  
Vol 85 (4) ◽  
Author(s):  
Bijoy Pal ◽  
S. N. Khaderi
Keyword(s):  
Mechanical Properties ◽  
Finite Element ◽  
Bloch Wave ◽  
Hydrostatic Compression ◽  
Inverse Opal ◽  
Wave Method ◽  
Yield Behavior ◽  
Cubic Symmetry ◽  
Hydrostatic Loading ◽  
Elastoplastic Properties

The idealized inverse-opal lattice is a network of slender struts that has cubic symmetry. We analytically investigate the elastoplastic properties of the idealized inverse-opal lattice. The analysis reveals that the inverse-opal lattice is bending-dominated under all loadings, except under pure hydrostatic compression or tension. Under hydrostatic loading, the lattice exhibits a stretching dominated behavior. Interestingly, for this lattice, Young's modulus and shear modulus are equal in magnitude. The analytical estimates for the elastic constants and yield behavior are validated by performing unit-cell finite element (FE) simulations. The hydrostatic buckling response of the idealized inverse-opal lattice is also investigated using the Floquet–Bloch wave method.

Why the Bloch Wave Solution for Reflection Fails on the Au(110) Surface

1990 ◽  
Vol 48 (2) ◽  
pp. 372-373
Author(s):  
YIQUN MA
Keyword(s):  
Electron Diffraction ◽  
Wave Solution ◽  
Incident Angle ◽  
High Energy ◽  
Bloch Wave ◽  
Energy Electron ◽  
Wave Method ◽  
High Energy Electron ◽  
Real Potential ◽  
Electron Reflection

The Bloch wave method has been widely used for interpreting reflection high energy electron diffraction (RHEED) patterns and the consistency between the theory and high energy electron reflection (HEER) experiments has been claimed by different authors. The recent rigorous investigation on the consistency between the Bloch wave method and the multislice approach due to Cowley and Moodie in the reflection case for Au(001) surface has also provided a clear theoretical proof for the validity of the Bloch wave method in reflection case. However, a severe deviation of the Bloch wave solution for the Au(110) surface in the reflection case from the stabilized solution of its multislicing via the multislice iteration has recently revealed by the BMCR method (Bloch wave + Multislice Combined for Reflection).Fig.1 shows the results calculated for the Au(110) surface using the BMCR method. The incident angle is 30mRad and the absorption is included by taking the imaginary potential as 10% of the real potential in both the Bloch wave and multislice calculation.

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