scholarly journals Superconducting Tunnel Junction Array Development for High-Resolution Energy-Dispersive X-ray Spectroscopy

1998 ◽  
Vol 4 (6) ◽  
pp. 616-621 ◽  
Author(s):  
S. Friedrich ◽  
C.A. Mears ◽  
B. Nideröst ◽  
L.J. Hiller ◽  
M. Frank ◽  
...  

Cryogenic energy-dispersive X-ray detectors are being developed because of their superior energy resolution (10 eV FWHM for keV X-rays) compared to that achieved in semiconductor energy-dispersive spectrometry (EDS) systems. So far, their range of application is limited because of their comparably small size and low count rate. We present data on the development of superconducting tunnel junction (STJ) detector arrays to address both of these issues. A single STJ detector has a resolution of around 10 eV below 1 keV and can be operated at count rates of the order 10,000 counts/sec. We show that the simultaneous operation of several STJ detectors does not dimish their energy resolution significantly, and it increases the detector area and the maximum count rate by a factor given by the total number of independent channels.

1998 ◽  
Vol 5 (3) ◽  
pp. 515-517 ◽  
Author(s):  
M. Frank ◽  
C. A. Mears ◽  
S. E. Labov ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
...  

Experimental results are presented obtained with a cryogenically cooled high-resolution X-ray spectrometer based on a 141 × 141 µm Nb-Al-Al2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates approaching those of semiconductor detectors while still providing a significantly better energy resolution for soft X-rays. By measuring fluorescence X-rays from samples containing transition metals and low-Z elements, an FWHM energy resolution of 6–15 eV for X-rays in the energy range 180–1100 eV has been obtained. The results show that, in the near future, STJ detectors may prove very useful in XRF and microanalysis applications.


1998 ◽  
Vol 69 (1) ◽  
pp. 25-31 ◽  
Author(s):  
M. Frank ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
C. A. Mears ◽  
S. E. Labov ◽  
...  

1997 ◽  
Vol 487 ◽  
Author(s):  
W. K. Warburton

AbstractIn this paper we examine a recently proposed concept for obtaining sub-pixel spatial resolution in compound semiconductors where hole transport properties are relatively poor. [1] This approach uses weighted sums and differences of local pixel signals to extract both accurate x-ray energy estimates and interpolate location at the sub-pixel level. A simple analysis, including noise estimates, suggests the possibility of obtaining locations at the 50–100 micron level using 1–2 mm wide stripe electrodes while obtaining 1–2% energy resolution for x-rays up to 100 keV. Following this examination, we will present the most recent experimental results from our program to develop electronics to implement this scheme.


2013 ◽  
Vol 23 (3) ◽  
pp. 2400504-2400504 ◽  
Author(s):  
Matthew H. Carpenter ◽  
Stephan Friedrich ◽  
John A. Hall ◽  
Jackson Harris ◽  
William K. Warburton ◽  
...  

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