scholarly journals Signature Analysis Applied to EDS Microanalysis

2008 ◽  
Vol 16 (4) ◽  
pp. 52-55
Author(s):  
J.W. Colby ◽  
D. C. Ward

Most spectroscopies (FTIR, XRD, RAMAN, MS, etc.), were developed in order to identify materials. This is accomplished by capturing the spectral “signature” of an unknown and matching it to those of a comprehensive database of reference materials. Development of these spectroscopies has included efforts to embellish the associated database. EDS evolved as a resource to provide qual/quant, and development has been to improve the accuracy of quantation. Until recently, EDS was not considered a spectroscopy to provide identification of materials.

2008 ◽  
Vol 16 (3) ◽  
pp. 20-23
Author(s):  
J. W. Colby ◽  
D. C. Ward

Most spectroscopies (FTIR, XRD, RAMAN, MS, etc.), were developed in order to identify materials. This is accomplished by capturing the spectral “signature” of an unknown and matching it to those of a comprehensive database of reference materials. Development of these spectroscopies has included efforts to embellish the associated database. EDS evolved as a resource to provide qual/quant, and development has been to improve the accuracy of quantation. Until recently, EDS was not considered a spectroscopy to provide identification of materials.


2021 ◽  
Vol 130 ◽  
pp. 108148
Author(s):  
A.W. Zulfa ◽  
K. Norizah ◽  
O. Hamdan ◽  
I. Faridah-Hanum ◽  
P.P. Rhyma ◽  
...  

2003 ◽  
Author(s):  
Gary J. Bishop ◽  
Mike J. Caola ◽  
Rachel M. Geatches ◽  
Nick C. Roberts

2021 ◽  
pp. 30-37
Author(s):  
Sergey V. Medvedevskikh ◽  
Egor P. Sobina ◽  
Olga N. Kremleva ◽  
Мaria Yu. Medvedevskikh ◽  
Alena V. Sobina ◽  
...  

The concept of reference materials metrological traceability establishment within the framework of Euro-Asian Cooperation of National Metrological Institutions (COOMET) Technical Committee 1.12 “Reference Materials” (TC 1.12) is overviewed. Particular cases of COOMET Reference Materials development are provided. The authors considered approaches to demonstrate a metrological traceability of reference materials with different types of their characterisation, e. g., appliance of national measurement standards, or performance of interlaboratory comparison testing, or usage of primary reference measurement procedure for reference materials characterisation if a state measurement standard for units is absent.


1991 ◽  
Author(s):  
Robert F. Rauchmiller, Jr. ◽  
Raymond S. Vanderbok

2013 ◽  
Vol 19 (S2) ◽  
pp. 1574-1575 ◽  
Author(s):  
M.R. Cavaliere

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


2003 ◽  
Vol 1 ◽  
pp. 155-160 ◽  
Author(s):  
D. Lupea ◽  
U. Pursche ◽  
H.-J. Jentschel

Abstract. In this paper, the Spectral Signature Analysis is presented as a concept for an integrable self-test system (Built-In Self-Test – BIST) for RF front-ends is presented. It is based on modelling the whole RF front-end (transmitter and receiver) on system level, on generating of a Spectral Signature and of evaluating of the Signature Response. Because of using multi-carrier signal as the test signature, the concept is especially useful for tests of linearity and frequency response of front-ends. Due to the presented method of signature response evaluation, this concept can be used for Built-In Self-Correction (BISC) at critical building blocks.


2011 ◽  
Vol 33 (9) ◽  
pp. 2706-2724 ◽  
Author(s):  
Bing Chen ◽  
Shaokun Li ◽  
Keru Wang ◽  
Guoqing Zhou ◽  
Junhua Bai

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