Simultaneous quantitative determination of the distribution of dopants in silicon by high mass resolution secondary ion mass spectrometry
1998 ◽
Vol 13
(7)
◽
pp. 597-601
◽
High mass resolution time-of-flight secondary ion mass spectrometry. Application to peak assignments
1989 ◽
Vol 14
(3)
◽
pp. 135-142
◽
2019 ◽
Vol 91
(14)
◽
pp. 8864-8872
◽
1989 ◽
Vol 7
(4)
◽
pp. 2532-2536
◽
2000 ◽
2010 ◽
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