Depth Profiling and Cross-Sectional Laser Ablation Ionization Mass Spectrometry Studies of Through-Silicon-Vias

2018 ◽  
Vol 90 (8) ◽  
pp. 5179-5186 ◽  
Author(s):  
Valentine Grimaudo ◽  
Pavel Moreno-García ◽  
Alena Cedeño López ◽  
Andreas Riedo ◽  
Reto Wiesendanger ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Laser Ablation ◽  
Depth Profiling ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Cross Sectional ◽  
Through Silicon Vias ◽  
Silicon Vias

scholarly journals Correction to Depth-Profiling Microanalysis of CoNCN Water-Oxidation Catalyst Using a λ = 46.9 nm Plasma-Laser for Nano-Ionization Mass Spectrometry

2018 ◽  
Vol 90 (20) ◽  
pp. 12322-12322
Author(s):  
Rafael Müeller ◽  
Ilya Kuznetsov ◽  
Yunieski Arbelo ◽  
Matthias Trottmann ◽  
Carmen S. Menoni ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Water Oxidation ◽  
Depth Profiling ◽  
Oxidation Catalyst ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Plasma Laser

Depth-Profiling Microanalysis of CoNCN Water-Oxidation Catalyst Using a λ = 46.9 nm Plasma Laser for Nano-Ionization Mass Spectrometry

2018 ◽  
Vol 90 (15) ◽  
pp. 9234-9240 ◽  
Author(s):  
Rafael Müller ◽  
Ilya Kuznetsov ◽  
Yunieski Arbelo ◽  
Matthias Trottmann ◽  
Carmen S. Menoni ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Water Oxidation ◽  
Depth Profiling ◽  
Oxidation Catalyst ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Plasma Laser

Remote ablation chamber for high efficiency particle transfer in laser ablation electrospray ionization mass spectrometry

The Analyst ◽  
2020 ◽  
Vol 145 (17) ◽  
pp. 5861-5869
Author(s):  
Marjan Dolatmoradi ◽  
Jarod A. Fincher ◽  
Andrew R. Korte ◽  
Nicholas J. Morris ◽  
Akos Vertes
Keyword(s):  
Mass Spectrometry ◽  
Laser Ablation ◽  
Electrospray Ionization ◽  
Electrospray Ionization Mass Spectrometry ◽  
High Efficiency ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Particle Transfer ◽  
Laser Ablation Electrospray Ionization

Improved remote ablation chamber for particle transfer in LAESI mass spectrometry.

Ion Microscopy with Resonant Ionization Mass Spectrometry: Time-of-Flight Depth Profiling with Improved Isotopic Precision

2010 ◽  
Vol 16 (3) ◽  
pp. 373-377 ◽  
Author(s):  
Michael J. Pellin ◽  
Igor V. Veryovkin ◽  
Jonathan Levine ◽  
Alexander Zinovev ◽  
Andrew M. Davis ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Ionization Mass Spectrometry ◽  
Ionization Mass ◽  
Resonant Ionization ◽  
Ion Microscopy
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