The cross-section ratios R of transfer ionization to single electron capture of Helium atom induced by fluorine ions in the strong-interaction region were measured by means of the position-sensitive-detection and the time-of-flight (TOF) technologies. The velocity and charge state dependence of R were studied. It is found that the R decreases when the 2q/v increases, where q and v are the charge state and velocity of projectile respectively. In this energy region the transfer ionization can be look as Two-Step process that one target electron is captured, and another electron is ionized.
Charge state dependence of channeled ion energy loss