Development of High-Reliability and -Stability Chemical Sensors Based on an Extended-Gate Type Amorphous Oxide Semiconductor Thin-Film Transistor

2020 ◽  
Vol 2 (2) ◽  
pp. 405-408 ◽  
Author(s):  
Yuki Hashima ◽  
Takanori Takahashi ◽  
Yasuaki Ishikawa ◽  
Yukiharu Uraoka
2012 ◽  
Vol 20 (10) ◽  
pp. 589-595 ◽  
Author(s):  
John F. Wager ◽  
Ken Hoshino ◽  
Eric S. Sundholm ◽  
Rick E. Presley ◽  
Ram Ravichandran ◽  
...  

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