An amorphous oxide semiconductor thin-film transistor route to oxide electronics

John F. Wager; Bao Yeh; Randy L. Hoffman; Douglas A. Keszler

doi:10.1016/j.cossms.2013.07.002

An amorphous oxide semiconductor thin-film transistor route to oxide electronics

Current Opinion in Solid State and Materials Science ◽

10.1016/j.cossms.2013.07.002 ◽

2014 ◽

Vol 18 (2) ◽

pp. 53-61 ◽

Cited By ~ 103

Author(s):

John F. Wager ◽

Bao Yeh ◽

Randy L. Hoffman ◽

Douglas A. Keszler

Keyword(s):

Thin Film ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Oxide Electronics ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Comprehensive Review on Amorphous Oxide Semiconductor Thin Film Transistor

Transactions on Electrical and Electronic Materials ◽

10.1007/s42341-020-00197-w ◽

2020 ◽

Vol 21 (3) ◽

pp. 235-248 ◽

Cited By ~ 1

Author(s):

Sang Yeol Lee

Keyword(s):

Thin Film ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Comprehensive Review ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Review of recent developments in amorphous oxide semiconductor thin-film transistor devices

Thin Solid Films ◽

10.1016/j.tsf.2011.07.018 ◽

2012 ◽

Vol 520 (6) ◽

pp. 1679-1693 ◽

Cited By ~ 655

Author(s):

Joon Seok Park ◽

Wan-Joo Maeng ◽

Hyun-Suk Kim ◽

Jin-Seong Park

Keyword(s):

Thin Film ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Recent Developments ◽

Semiconductor Thin Film

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Development of High-Reliability and -Stability Chemical Sensors Based on an Extended-Gate Type Amorphous Oxide Semiconductor Thin-Film Transistor

ACS Applied Electronic Materials ◽

10.1021/acsaelm.9b00844 ◽

2020 ◽

Vol 2 (2) ◽

pp. 405-408 ◽

Cited By ~ 2

Author(s):

Yuki Hashima ◽

Takanori Takahashi ◽

Yasuaki Ishikawa ◽

Yukiharu Uraoka

Keyword(s):

Thin Film ◽

Chemical Sensors ◽

High Reliability ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Effects of microwave annealing on electrical enhancement of amorphous oxide semiconductor thin film transistor

Applied Physics Letters ◽

10.1063/1.4754627 ◽

2012 ◽

Vol 101 (13) ◽

pp. 132901 ◽

Cited By ~ 64

Author(s):

Li-Feng Teng ◽

Po-Tsun Liu ◽

Yuan-Jou Lo ◽

Yao-Jen Lee

Keyword(s):

Thin Film ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Microwave Annealing ◽

Semiconductor Thin Film

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A framework for assessing amorphous oxide semiconductor thin-film transistor passivation

Journal of the Society for Information Display ◽

10.1002/jsid.120 ◽

2012 ◽

Vol 20 (10) ◽

pp. 589-595 ◽

Cited By ~ 4

Author(s):

John F. Wager ◽

Ken Hoshino ◽

Eric S. Sundholm ◽

Rick E. Presley ◽

Ram Ravichandran ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Review paper: Transparent amorphous oxide semiconductor thin film transistor

Electronic Materials Letters ◽

10.1007/s13391-011-0301-x ◽

2011 ◽

Vol 7 (1) ◽

pp. 1-11 ◽

Cited By ~ 188

Author(s):

Jang-Yeon Kwon ◽

Do-Joong Lee ◽

Ki-Bum Kim

Keyword(s):

Thin Film ◽

Review Paper ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Enhanced Phase Stability and Carrier Suppression of Ternary Cation-Based Amorphous Oxide Semiconductor Thin Film Transistors

ECS Meeting Abstracts ◽

10.1149/ma2021-01511999mtgabs ◽

2021 ◽

Vol MA2021-01 (51) ◽

pp. 1999-1999

Author(s):

Mingyuan Liu ◽

Han Wook Song ◽

Sunghwan Lee

Keyword(s):

Thin Film ◽

Phase Stability ◽

Thin Film Transistors ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Silicon-doped indium oxide – a promising amorphous oxide semiconductor material for thin-film transistor fabricated by spin coating method

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/625/1/012002 ◽

2019 ◽

Vol 625 ◽

pp. 012002 ◽

Cited By ~ 1

Author(s):

Ha Hoang ◽

Kazutaka Sasaki ◽

Tatsuki Hori ◽

Kazuhito Tsukagoshi ◽

Toshihide Nabatame ◽

...

Keyword(s):

Thin Film ◽

Indium Oxide ◽

Spin Coating ◽

Thin Film Transistor ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Spin Coating Method ◽

Amorphous Oxide Semiconductor ◽

Coating Method ◽

Silicon Doped

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(Invited) Channel Width and Channel Length Dependencies in Amorphous-Oxide-Semiconductor Thin-Film Transistors: From a Device Structure Perspective

ECS Transactions ◽

10.1149/05008.0151ecst ◽

2013 ◽

Vol 50 (8) ◽

pp. 151-159 ◽

Cited By ~ 4

Author(s):

M. Mativenga ◽

J. K. Um ◽

R. Mruthyunjaya ◽

J. H. Chang ◽

G. N. Heiler ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Channel Length ◽

Channel Width ◽

Oxide Semiconductor ◽

Device Structure ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film

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Bias-induced migration of ionized donors in amorphous oxide semiconductor thin-film transistors with full bottom-gate and partial top-gate structures

AIP Advances ◽

10.1063/1.4742853 ◽

2012 ◽

Vol 2 (3) ◽

pp. 032129 ◽

Cited By ~ 9

Author(s):

Mallory Mativenga ◽

Tae-Ha Hwang ◽

Jin Jang

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Oxide Semiconductor ◽

Amorphous Oxide ◽

Amorphous Oxide Semiconductor ◽

Semiconductor Thin Film ◽

Bottom Gate

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