scholarly journals Quantitative Conductive Atomic Force Microscopy on Single-Walled Carbon Nanotube-Based Polymer Composites

2016 ◽  
Vol 8 (30) ◽  
pp. 19701-19708 ◽  
Author(s):  
Oana A. Bârsan ◽  
Günter G. Hoffmann ◽  
Leendert G. J. van der Ven ◽  
Gijsbertus de With
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Polymer Composites ◽  
Conductive Atomic Force Microscopy ◽  
Single Walled Carbon Nanotube ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force

scholarly journals Controlling conducting channels of single-walled carbon nanotube array with atomic force microscopy

2017 ◽  
Vol 7 (8) ◽  
pp. 759-764 ◽  
Author(s):  
Jean Pierre Nshimiyimana ◽  
Jian Zhang ◽  
Xiao Hu ◽  
Xiannian Chi ◽  
Pei Wu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Nanotube Array ◽  
Single Walled Carbon Nanotube ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Carbon Nanotube Array ◽  
Atomic Force

Dispersibility of Carbon Nanotubes

2007 ◽  
Vol 537-538 ◽  
pp. 161-168 ◽  
Author(s):  
T. Gábor ◽  
D. Aranyi ◽  
Katalin Papp ◽  
F.H. Kármán ◽  
Erika Kálmán
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Polymer Composites ◽  
Ionic Surfactant ◽  
Geometrical Parameters ◽  
Stable Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dispersion Agent

Availability of a stable carbon nanotube suspension is a prerequisite for production of polymer composites with carbon nanotube as additives. In this work nanotube suspensions, which have been prepared from various nanotubes in different dispersion agents, were compared. Dispersibility of the samples was investigated by scanning electon microscopy and atomic force microscopy. Solution of a non-ionic surfactant was also used successfully as a new dispersion agent. Geometrical parameters of the carbon nanotubes were determined by using atomic force microscopy. Correlation was found between the dispersibility and the parameters of the nanotubes and relative permittivity of the different solvents.

scholarly journals Carbon nanotube modified probes for stable and high sensitivity conductive atomic force microscopy

2016 ◽  
Vol 27 (47) ◽  
pp. 475708 ◽  
Author(s):  
Ashley D Slattery ◽  
Cameron J Shearer ◽  
Christopher T Gibson ◽  
Joseph G Shapter ◽  
David A Lewis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
High Sensitivity ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3707-3710 ◽  
Author(s):  
Nami Choi ◽  
Takayuki Uchihashi ◽  
Hidehiro Nishijima ◽  
Takao Ishida ◽  
Wataru Mizutani ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes
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