scholarly journals In Situ Focused Ion Beam Scanning Electron Microscope Study of Microstructural Evolution of Single Tin Particle Anode for Li-Ion Batteries

2019 ◽  
Vol 11 (2) ◽  
pp. 1733-1738 ◽  
Author(s):  
Xinwei Zhou ◽  
Tianyi Li ◽  
Yi Cui ◽  
Yongzhu Fu ◽  
Yuzi Liu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microscope Study ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Li Ion Batteries ◽  
Scanning Electron Microscope Study ◽  
Li Ion ◽  
Scanning Electron

In-situ integrity control of frozen-hydrated, vitreous lamellas prepared by the cryo-focused ion beam-scanning electron microscope

2013 ◽  
Vol 183 (1) ◽  
pp. 11-18 ◽  
Author(s):  
D.A. Matthijs de Winter ◽  
Rob J. Mesman ◽  
Michael F. Hayles ◽  
Chris T.W.M. Schneijdenberg ◽  
Cliff Mathisen ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron

Development of Hybrid MEMS/FIB Processes and Applications of Three-pronged Active Nanotweezers For Manipulation of Nano Objects

2006 ◽  
Vol 983 ◽  
Author(s):  
Xuefeng Wang ◽  
Chang Liu
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
In Situ Characterization ◽  
End Effectors ◽  
Scanning Electron

AbstractWe report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.

In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM)

2017 ◽  
Vol 79 ◽  
pp. 314-320 ◽  
Author(s):  
Renuka Vallabhaneni ◽  
Ehsan Izadi ◽  
Carl R. Mayer ◽  
C. Shashank Kaira ◽  
Sudhanshu S. Singh ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Tensile Testing ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Sn Whiskers ◽  
Scanning Electron ◽  
In Situ Tensile Testing
Sign in / Sign up

Export Citation Format

Share Document