Electro-Nanopatterning of Surface Relief Gratings on Azobenzene Layer-by-Layer Ultrathin Films by Current-Sensing Atomic Force Microscopy

2006 ◽  
Vol 110 (35) ◽  
pp. 17309-17314 ◽  
Author(s):  
Akira Baba ◽  
Guoqian Jiang ◽  
Kang-Min Park ◽  
Jin-Young Park ◽  
Hoon-Kyu Shin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrathin Films ◽  
Surface Relief ◽  
Layer By Layer ◽  
Current Sensing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Relief Gratings

Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

2008 ◽  
Vol 1143 ◽  
Author(s):  
Bijandra Kumar ◽  
Mickaël Castro ◽  
Jianbo Lu ◽  
Jean-François Feller
Keyword(s):  
Atomic Force Microscopy ◽  
Spray Deposition ◽  
Dynamic Mode ◽  
Layer By Layer ◽  
Initial State ◽  
Contact Mode ◽  
Current Sensing ◽  
Multi Wall Carbon Nanotubes ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTOrganic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

Atomic force microscopy inspection of the early state of formation of polymer surface relief gratings

2001 ◽  
Vol 79 (15) ◽  
pp. 2357-2359 ◽  
Author(s):  
O. Henneberg ◽  
Th. Geue ◽  
M. Saphiannikova ◽  
U. Pietsch ◽  
L. F. Chi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Relief ◽  
Polymer Surface ◽  
Force Microscopy ◽  
Early State ◽  
Atomic Force ◽  
Surface Relief Gratings

Fabrication of surface-relief gratings on an azobenzene-containing epoxy-based polymer film using atomic force microscopy

2010 ◽  
Vol 59 (10) ◽  
pp. 1422-1427 ◽  
Author(s):  
Raquel Fernández ◽  
Iñaki Zalakain ◽  
José Angel Ramos ◽  
María J Galante ◽  
Patricia A Oyanguren ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Film ◽  
Surface Relief ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Relief Gratings

Self-assembly layer-by-layer fabrication using porphyrin dye anion and polycation

2009 ◽  
Vol 13 (07) ◽  
pp. 774-778 ◽  
Author(s):  
Byung-Soon Kim ◽  
Young-A Son
Keyword(s):  
Ultrathin Films ◽  
Self Assembly ◽  
Film Surface ◽  
Layer By Layer ◽  
Preparation Technique ◽  
Force Microscopy ◽  
Atomic Force ◽  
Diallyldimethylammonium Chloride ◽  
Afm Analysis ◽  
Progressive Growth

In this study, self-assembled alternating film using poly(diallyldimethylammonium chloride) (PDDAC) and meso-tetrakis(4-carboxyphenyl)porphyrin (MTCP) was prepared as a multilayer deposition on glass substrate. This preparation technique for dye deposition may provide new feasibilities to achieve the manufacture of ultrathin films for nanotechnology application. The deposition films were characterized by UV-vis spectrophotometer and Atomic Force Microscopy (AFM) analysis. The results of UV-vis spectra showed that the absorbance characteristic of the multilayer films linearly increased with an increased number of PDDAC and MTCP bilayers. AFM analysis showed the film surface was relatively uniform and the progressive growth of layers was determined.

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