Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

2008 ◽  
Vol 1143 ◽  
Author(s):  
Bijandra Kumar ◽  
Mickaël Castro ◽  
Jianbo Lu ◽  
Jean-François Feller
Keyword(s):  
Atomic Force Microscopy ◽  
Spray Deposition ◽  
Dynamic Mode ◽  
Layer By Layer ◽  
Initial State ◽  
Contact Mode ◽  
Current Sensing ◽  
Multi Wall Carbon Nanotubes ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTOrganic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

Electro-Nanopatterning of Surface Relief Gratings on Azobenzene Layer-by-Layer Ultrathin Films by Current-Sensing Atomic Force Microscopy

2006 ◽  
Vol 110 (35) ◽  
pp. 17309-17314 ◽  
Author(s):  
Akira Baba ◽  
Guoqian Jiang ◽  
Kang-Min Park ◽  
Jin-Young Park ◽  
Hoon-Kyu Shin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ultrathin Films ◽  
Surface Relief ◽  
Layer By Layer ◽  
Current Sensing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Relief Gratings

scholarly journals Improved atomic force microscopy cantilever performance by partial reflective coating

2015 ◽  
Vol 6 ◽  
pp. 1450-1456 ◽  
Author(s):  
Zeno Schumacher ◽  
Yoichi Miyahara ◽  
Laure Aeschimann ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
High Vacuum ◽  
Low Frequency ◽  
Beam Deflection ◽  
High Signal ◽  
Dynamic Mode ◽  
Contact Mode ◽  
Force Microscopy ◽  
Reflective Coating ◽  
Atomic Force

Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds.

scholarly journals Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

2015 ◽  
Vol 6 ◽  
pp. 215-222 ◽  
Author(s):  
Gemma Rius ◽  
Matteo Lorenzoni ◽  
Soichiro Matsui ◽  
Masaki Tanemura ◽  
Francesc Perez-Murano
Keyword(s):  
Atomic Force Microscopy ◽  
Electric Field ◽  
Anodic Oxidation ◽  
Carbon Nanofiber ◽  
Great Promise ◽  
Dynamic Mode ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Anodic Oxidation

Many nanofabrication methods based on scanning probe microscopy have been developed during the last decades. Local anodic oxidation (LAO) is one of such methods: Upon application of an electric field between tip and surface under ambient conditions, oxide patterning with nanometer-scale resolution can be performed with good control of dimensions and placement. LAO through the non-contact mode of atomic force microscopy (AFM) has proven to yield a better resolution and tip preservation than the contact mode and it can be effectively performed in the dynamic mode of AFM. The tip plays a crucial role for the LAO-AFM, because it regulates the minimum feature size and the electric field. For instance, the feasibility of carbon nanotube (CNT)-functionalized tips showed great promise for LAO-AFM, yet, the fabrication of CNT tips presents difficulties. Here, we explore the use of a carbon nanofiber (CNF) as the tip apex of AFM probes for the application of LAO on silicon substrates in the AFM amplitude modulation dynamic mode of operation. We show the good performance of CNF-AFM probes in terms of resolution and reproducibility, as well as demonstration that the CNF apex provides enhanced conditions in terms of field-induced, chemical process efficiency.

Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy

Open Physics ◽  
2011 ◽  
Vol 9 (2) ◽  
Author(s):  
Andrzej Sikora ◽  
Lukasz Bednarz
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Torsional Oscillation ◽  
Dynamic Mode ◽  
Contact Mode ◽  
Force Microscopy ◽  
Complex Information ◽  
Atomic Force ◽  
Phase Images ◽  
Time Regime

AbstractThe measurement of the surface topography in dynamic mode (intermittent contact mode) is one of the most popular ways of imaging surfaces at nanoscale with atomic force microscopy. It also allows obtaining so called phase images which reveal the viscous-elastic non-homogeneities of the surface, therefore can be used for detecting the presence of different materials. It is, however, very difficult to interpret the phase map due to the origin of phenomena, method of signal detection and processing. Therefore one cannot determine whether the observed feature is caused by increase or decrease of any of specific mechanical properties of the surface. In this article we present the modified setup of commercially available AFM, where detection of torsional oscillation of the cantilever is used for the determination of mechanical properties such as: elasticity, adhesion, peak force and energy dissipation. By advanced signal processing, the reconstruction of the force spectroscopy curve and the calculation of mentioned parameters are performed. All the operations are done in real time regime. The developed method allows one to obtain much more complex information about measured surface. Test measurement results are also presented.

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Contact and non-contact mode imaging by atomic force microscopy

1996 ◽  
Vol 273 (1-2) ◽  
pp. 138-142 ◽  
Author(s):  
Seizo Morita ◽  
Satoru Fujisawa ◽  
Eigo Kishi ◽  
Masahiro Ohta ◽  
Hitoshi Ueyama ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

Conductance Mapping of Proton Exchange Membranes by Current Sensing Atomic Force Microscopy

2009 ◽  
Vol 113 (45) ◽  
pp. 15040-15046 ◽  
Author(s):  
Yihong Kang ◽  
Osung Kwon ◽  
Xin Xie ◽  
Da-Ming Zhu
Keyword(s):  
Atomic Force Microscopy ◽  
Proton Exchange Membranes ◽  
Proton Exchange ◽  
Current Sensing ◽  
Force Microscopy ◽  
Atomic Force
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