Structural Characterization of Mixed-Stack Charge Transfer Films of 2-Octadecyl-7,7,8,8-tetracyanoquinodimethane and 5,10-Dimethyl-5,10-dihydrophenazine Prepared by the Langmuir−Blodgett Technique and Donor Doping. 3. Thickness Dependence of Thermal Behavior Investigated by Ultraviolet−Visible−Near-Infrared and Infrared Spectroscopies and X-ray Diffraction

Yan Wang; Katsuhiro Nichogi; Keiji Iriyama; Yukihiro Ozaki

doi:10.1021/jp970409j

Structural Characterization of Mixed-Stack Charge Transfer Films of 2-Octadecyl-7,7,8,8-tetracyanoquinodimethane and 5,10-Dimethyl-5,10-dihydrophenazine Prepared by the Langmuir−Blodgett Technique and Donor Doping. 3. Thickness Dependence of Thermal Behavior Investigated by Ultraviolet−Visible−Near-Infrared and Infrared Spectroscopies and X-ray Diffraction

The Journal of Physical Chemistry B ◽

10.1021/jp970409j ◽

1997 ◽

Vol 101 (33) ◽

pp. 6379-6383 ◽

Cited By ~ 4

Author(s):

Yan Wang ◽

Katsuhiro Nichogi ◽

Keiji Iriyama ◽

Yukihiro Ozaki

Keyword(s):

Charge Transfer ◽

Thermal Behavior ◽

Structural Characterization ◽

Near Infrared ◽

Thickness Dependence ◽

X Ray Diffraction ◽

X Ray ◽

Langmuir Blodgett ◽

Transfer Films

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Structural Characterization of Mixed-Stack Charge Transfer Films of 2-Octadecyl-7,7,8,8-tetracyanoquinodimethane and 5,10-Dimethyl-5,10-dihydrophenazine Prepared by the Langmuir−Blodgett Technique and Donor Doping. 1. Molecular Orientation and Structure Investigated by Ultraviolet−Visible−Near-Infrared and Infrared Spectroscopies and X-ray Diffraction

The Journal of Physical Chemistry B ◽

10.1021/jp970405e ◽

1997 ◽

Vol 101 (33) ◽

pp. 6367-6371 ◽

Cited By ~ 7

Author(s):

Yan Wang ◽

Katsuhiro Nichogi ◽

Keiji Iriyama ◽

Yukihiro Ozaki

Keyword(s):

Charge Transfer ◽

Structural Characterization ◽

Molecular Orientation ◽

Near Infrared ◽

X Ray Diffraction ◽

X Ray ◽

Langmuir Blodgett ◽

Donor Doping ◽

Transfer Films

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Structural Characterization of Mixed-Stack Charge Transfer Films of 2-Octadecyl-7,7,8,8-tetracyanoquinodimethane and 5,10-Dimethyl-5,10-dihydrophenazine Prepared by the Langmuir−Blodgett Technique and Donor Doping. 2. Morphology and Annealing Effects Investigated by Atomic Force Microscopy and Ultraviolet−Visible−Near-Infrared, and Infrared Spectroscopies

The Journal of Physical Chemistry B ◽

10.1021/jp970408r ◽

1997 ◽

Vol 101 (33) ◽

pp. 6372-6378 ◽

Cited By ~ 3

Author(s):

Yan Wang ◽

Katsuhiro Nichogi ◽

Keiji Iriyama ◽

Yukihiro Ozaki

Keyword(s):

Atomic Force Microscopy ◽

Charge Transfer ◽

Structural Characterization ◽

Near Infrared ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Transfer Films ◽

Annealing Effects

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Structural characterization of Langmuir–Blodgett films by X-ray diffraction in transmission geometry

Thin Solid Films ◽

10.1016/s0040-6090(98)00540-9 ◽

1998 ◽

Vol 330 (2) ◽

pp. 157-160 ◽

Cited By ~ 4

Author(s):

Bin Yang ◽

Ying Qiao

Keyword(s):

Structural Characterization ◽

X Ray Diffraction ◽

X Ray ◽

Langmuir Blodgett ◽

Transmission Geometry ◽

Langmuir Blodgett Films

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Thermal Behavior of Mixed-Stack Charge Transfer Films of 2-Octadecyl-7,7,8,8-tetracyanoquinodimethane and 3,3‘,5,5‘-Tetramethylbenzidine Prepared by the Langmuir−Blodgett Technique and Donor Doping. 1. Dependence of Thermal Behavior on the Number of Layers Studied by Ultraviolet−Visible−Near Infrared and Infrared Spectroscopies

The Journal of Physical Chemistry ◽

10.1021/jp9607677 ◽

1996 ◽

Vol 100 (43) ◽

pp. 17232-17237 ◽

Cited By ~ 16

Author(s):

Yan Wang ◽

Katsuhiro Nichogi ◽

Keiji Iriyama ◽

Yukihiro Ozaki

Keyword(s):

Charge Transfer ◽

Thermal Behavior ◽

Near Infrared ◽

Langmuir Blodgett ◽

Donor Doping ◽

Number Of Layers ◽

Transfer Films

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Structural Characterization of Metal Phosphonate Langmuir−Blodgett Films by Grazing Incidence X-ray Diffraction

Langmuir ◽

10.1021/la026046i ◽

2002 ◽

Vol 18 (21) ◽

pp. 8260-8262 ◽

Cited By ~ 1

Author(s):

Jeffrey T. Culp ◽

Mark Davidson ◽

Randolph S. Duran ◽

Daniel R. Talham

Keyword(s):

Structural Characterization ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray ◽

Langmuir Blodgett ◽

Metal Phosphonate ◽

Langmuir Blodgett Films

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Thermal Behavior of Mixed-Stack Charge Transfer Films of 2-Octadecyl-7,7,8,8-tetracyanoquinodimethane and 3,3‘,5,5‘-Tetramethylbenzidine Prepared by the Langmuir−Blodgett Technique and Donor Doping. 2. Morphology and Annealing Effects of the Films Investigated by Atomic Force Microscopy and Ultraviolet−Visible−Near Infrared and Infrared Spectroscopies

The Journal of Physical Chemistry ◽

10.1021/jp960751g ◽

1996 ◽

Vol 100 (43) ◽

pp. 17238-17242 ◽

Cited By ~ 12

Author(s):

Yan Wang ◽

Katsuhiro Nichogi ◽

Keiji Iriyama ◽

Yukihiro Ozaki

Keyword(s):

Atomic Force Microscopy ◽

Charge Transfer ◽

Thermal Behavior ◽

Near Infrared ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Donor Doping ◽

Atomic Force ◽

Transfer Films ◽

Annealing Effects

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Structural Characterization of Langmuir−Blodgett Films of Octadecyldimethylamine Oxide and Dioctadecyldimethylammonium Chloride. 2. Thickness Dependence of Thermal Behavior Investigated by Infrared Spectroscopy and Wetting Measurements

Langmuir ◽

10.1021/la981016u ◽

1999 ◽

Vol 15 (10) ◽

pp. 3601-3607 ◽

Cited By ~ 18

Author(s):

Diyas A. Myrzakozha ◽

Takeshi Hasegawa ◽

Jujiro Nishijo ◽

Toyoko Imae ◽

Yukihiro Ozaki

Keyword(s):

Infrared Spectroscopy ◽

Thermal Behavior ◽

Structural Characterization ◽

Thickness Dependence ◽

Langmuir Blodgett ◽

Langmuir Blodgett Films

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Rapid chemical and structural characterization of metastable thin-film libraries by a combination of electron probe microanalysis and scanning x-ray diffraction

Surface and Interface Analysis ◽

10.1002/sia.1388 ◽

2002 ◽

Vol 34 (1) ◽

pp. 686-689 ◽

Cited By ~ 5

Author(s):

R. Cremer ◽

S. Richter

Keyword(s):

Thin Film ◽

Structural Characterization ◽

Electron Probe Microanalysis ◽

Electron Probe ◽

X Ray Diffraction ◽

X Ray

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Structural characterization of nanocrystalline CrOOH·2H2O aerogel by X-ray diffraction

Journal of Physics and Chemistry of Solids ◽

10.1016/j.jpcs.2004.08.043 ◽

2005 ◽

Vol 66 (1) ◽

pp. 81-90 ◽

Cited By ~ 3

Author(s):

A. Erenburg ◽

E. Gartstein ◽

M. Landau

Keyword(s):

Structural Characterization ◽

X Ray Diffraction ◽

X Ray

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Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

Thin Solid Films ◽

10.1016/s0040-6090(97)00097-7 ◽

1997 ◽

Vol 306 (2) ◽

pp. 198-204 ◽

Cited By ~ 13

Author(s):

A.A. Darhuber ◽

J. Stangl ◽

V. Holy ◽

G. Bauer ◽

A. Krost ◽

...

Keyword(s):

Quantum Dot ◽

Structural Characterization ◽

X Ray Diffraction ◽

X Ray ◽

Self Assembled

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