In situ Atomic Force Microscopy Imaging of Electroprecipitated Nickel Hydrous Oxide Films in Alkaline Electrolytes

Langmuir ◽  
1994 ◽  
Vol 10 (11) ◽  
pp. 3933-3936 ◽  
Author(s):  
Rong-rong Chen ◽  
Yibo Mo ◽  
Daniel A. Scherson
Keyword(s):  
Atomic Force Microscopy ◽  
Oxide Films ◽  
Hydrous Oxide ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Alkaline Electrolytes ◽  
Atomic Force Microscopy Imaging

scholarly journals Development of an algorithm for tip-related artifacts identification in AFM biological film imaging

2005 ◽  
Vol 48 (4) ◽  
pp. 667-674 ◽  
Author(s):  
Rubens Bernardes-Filho ◽  
Odilio Benedito Garrido de Assis
Keyword(s):  
Atomic Force Microscopy ◽  
Simple Algorithm ◽  
Major Drawback ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Microscopy Images ◽  
Polysaccharide Film

One major drawback identified in atomic force microscopy imaging is the dependence of the image's precision on the shape of the probe tip. In this paper a simple algorithm is proposed to provide artifact identification signaling in-situ tip features in atomic force microscopy images. The base of the identifications lied when the angle formed between two scanned points was kept the same as the tip sweeps a certain length of the sample. The potential of the described method was illustrated on a chitosan polysaccharide film. The images produced were compared to evaluate tip-artifact regions. This algorithm showed promise as a tool in the measurement and characterization fields to separate true images from artificial images in probe microscopy.

In Situ Atomic Force Microscopy Imaging of Block Copolymer Micelles Adsorbed on a Solid Substrate

Langmuir ◽  
2003 ◽  
Vol 19 (24) ◽  
pp. 10449-10453 ◽  
Author(s):  
Simon D. Connell ◽  
Stephen Collins ◽  
Johan Fundin ◽  
Zhuo Yang ◽  
Ian W. Hamley
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Solid Substrate ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Block Copolymer Micelles ◽  
Copolymer Micelles

Real-Time In Situ Atomic Force Microscopy Imaging of Bismuth Crystal Growth

Langmuir ◽  
2009 ◽  
Vol 25 (19) ◽  
pp. 11228-11231 ◽  
Author(s):  
Sara E. C. Dale ◽  
Simon J. Bending ◽  
Laurence M. Peter
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Real Time ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bismuth Crystal ◽  
Atomic Force Microscopy Imaging

In Situ Atomic Force Microscopy Imaging of Electrodeposition of Mixed Layers of Copper/Cuprous Oxide

1999 ◽  
Vol 146 (11) ◽  
pp. 4101-4104 ◽  
Author(s):  
A. Bonnefont ◽  
R. Kostecki ◽  
F. McLarnon ◽  
J. C. Arrayet ◽  
L. Servant ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cuprous Oxide ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mixed Layers

In situ Atomic Force Microscopy Imaging of Polymer Degradation in an Aqueous Environment

Langmuir ◽  
1994 ◽  
Vol 10 (12) ◽  
pp. 4417-4419 ◽  
Author(s):  
K. M. Shakesheff ◽  
M. C. Davies ◽  
C. J. Roberts ◽  
S. J. B. Tendler ◽  
A. G. Shard ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Degradation ◽  
Aqueous Environment ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

scholarly journals Tuning Metastability of Poly(3-hexyl thiophene) Solutions to Enable in Situ Atomic Force Microscopy Imaging of Surface Nucleation

2019 ◽  
Vol 52 (20) ◽  
pp. 7756-7761 ◽  
Author(s):  
Daniel E. Acevedo-Cartagena ◽  
Jiaxin Zhu ◽  
Marta Kocun ◽  
Stephen S. Nonnenmann ◽  
Ryan C. Hayward
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Surface Nucleation ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging
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