Lateral Force Calibration: Accurate Procedures for Colloidal Probe Friction Measurements in Atomic Force Microscopy

Langmuir ◽  
2010 ◽  
Vol 26 (2) ◽  
pp. 1386-1394 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Jon R. Pratt ◽  
Mark G. Reitsma
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

Sliding Friction by Atomic Force Microscopy

1998 ◽  
Vol 543 ◽  
Author(s):  
V. Pasquier ◽  
J. M. Drake
Keyword(s):  
Atomic Force Microscopy ◽  
Sliding Friction ◽  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Load Dependence ◽  
Silica Surfaces ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

AbstractLateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration
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