scholarly journals Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

2006 ◽  
Vol 77 (5) ◽  
pp. 053701 ◽  
Author(s):  
Rachel J. Cannara ◽  
Michael Eglin ◽  
Robert W. Carpick
Keyword(s):  
Atomic Force Microscopy ◽  
Calibration Method ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration

Sliding Friction by Atomic Force Microscopy

1998 ◽  
Vol 543 ◽  
Author(s):  
V. Pasquier ◽  
J. M. Drake
Keyword(s):  
Atomic Force Microscopy ◽  
Sliding Friction ◽  
Lateral Force ◽  
Lateral Force Microscopy ◽  
Force Microscopy ◽  
Load Dependence ◽  
Silica Surfaces ◽  
Atomic Force ◽  
Friction Measurements ◽  
Force Calibration

AbstractLateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

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