Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer-Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization–Mass Spectrometry

ACS Nano ◽  
2011 ◽  
Vol 5 (7) ◽  
pp. 5526-5531 ◽  
Author(s):  
Olga S. Ovchinnikova ◽  
Maxim P. Nikiforov ◽  
James A. Bradshaw ◽  
Stephen Jesse ◽  
Gary J. Van Berkel
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