Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer-Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization–Mass Spectrometry
2014 ◽
Vol 29
(2)
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pp. 163-170
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2019 ◽
Vol 27
(2)
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pp. 451-459
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2016 ◽
Vol 30
(21)
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pp. 2315-2322
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