scholarly journals Precise characterization of outermost surface of crystalline–crystalline diblock copolymer thin films using synchrotron radiation soft X-ray photoelectron spectroscopy

2014 ◽  
Vol 46 (10) ◽  
pp. 637-640 ◽  
Author(s):  
Shiki Nojima ◽  
Takamichi Shinohara ◽  
Yuji Higaki ◽  
Ryohei Ishige ◽  
Tomoyuki Ohishi ◽  
...  
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Diblock Copolymer ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Outermost Surface ◽  
Precise Characterization

The Growth and Characterization of Germanium-Carbon Alloy Thin Films

1992 ◽  
Vol 270 ◽  
Author(s):  
Haojie Yuan ◽  
R. Stanley Williams
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Vacuum Chamber ◽  
Optical Band Gap ◽  
High Vacuum ◽  
Optical Absorption Spectroscopy ◽  
Alloy Thin Film ◽  
New Materials ◽  
X Ray

ABSTRACTThin films of pure germanium-carbon alloys (GexC1−x with x ≈ 0.0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) have been grown on Si(100) and A12O3 (0001) substrates by pulsed laser ablation in a high vacuum chamber. The films were analyzed by x-ray θ-2θ diffraction (XRD), x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), conductivity measurements and optical absorption spectroscopy. The analyses of these new materials showed that films of all compositions were amorphous, free of contamination and uniform in composition. By changing the film composition, the optical band gap of these semiconducting films was varied from 0.00eV to 0.85eV for x = 0.0 to 1.0 respectively. According to the AES results, the carbon atoms in the Ge-C alloy thin film samples has a bonding configuration that is a mixture of sp2 and sp3 hybridizations.

X-ray diffraction and X-ray photoelectron spectroscopy characterization of sulfurized tin thin films deposited by thermal evaporation

2018 ◽  
Vol 645 ◽  
pp. 409-416
Author(s):  
Hiroto Oomae ◽  
Takahito Eguchi ◽  
Kunihiko Tanaka ◽  
Misao Yamane ◽  
Naofumi Ohtsu
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Thermal Evaporation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Tin Thin Films

X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

1995 ◽  
Vol 258 (1-2) ◽  
pp. 110-114 ◽  
Author(s):  
L. Benoist ◽  
D. Gonbeau ◽  
G. Pfister-Guillouzo ◽  
E. Schmidt ◽  
G. Meunier ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
X Ray
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