Surface phase transitions of a Lennard-Jones fluid in contact with a permeable wall of finite thickness: a density functional approach

2000 ◽  
Vol 2 (14) ◽  
pp. 3227-3234 ◽  
Author(s):  
Paweł Bryk ◽  
Andrzej Patrykiejew ◽  
Stefan Sokołowski
1999 ◽  
Vol 96 (10) ◽  
pp. 1509-1516 ◽  
Author(s):  
PAWEŁ BRYK ◽  
ANDRZEJ PATRYKIEJEW ◽  
JOANNA RESZKO-ZYGMUNT ◽  
STEFAN SOKOŁOWSKI

2003 ◽  
Vol 91 (7) ◽  
Author(s):  
Junren Shi ◽  
Biao Wu ◽  
X. C. Xie ◽  
E. W. Plummer ◽  
Zhenyu Zhang

1989 ◽  
Vol 159 ◽  
Author(s):  
E. Bauer ◽  
M. Mundschau ◽  
W. Swiech ◽  
W. Telieps

ABSTRACTLow energy electron microscopy (LEEM) is briefly introduced and its application to the study of surface defects, surface phase transitions on Si(111), crystal growth and sublimation on Si(100) is illustrated.


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