Spectroscopic evidence for the origin of odd–even effects in self-assembled monolayers and effects of substrate roughness

2017 ◽  
Vol 19 (10) ◽  
pp. 6989-6995 ◽  
Author(s):  
Jiahao Chen ◽  
Jian Liu ◽  
Ian D. Tevis ◽  
Richard S. Andino ◽  
Christina M. Miller ◽  
...  
Keyword(s):  
Sum Frequency Generation ◽  
Self Assembled Monolayers ◽  
Substrate Roughness ◽  
Spectroscopic Evidence ◽  
Sum Frequency ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Frequency Generation

This paper reports the effects of substrate roughness on the odd–even effect in n-alkanethiolate self-assembled monolayers (SAMs) probed by vibrational sum frequency generation (SFG) spectroscopy.

Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers

2003 ◽  
Vol 83 (18) ◽  
pp. 3830-3832 ◽  
Author(s):  
K. Kuhnke ◽  
D. M. P. Hoffmann ◽  
X. C. Wu ◽  
A. M. Bittner ◽  
K. Kern
Keyword(s):  
Chemical Imaging ◽  
Sum Frequency Generation ◽  
Self Assembled Monolayers ◽  
Sum Frequency ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Frequency Generation
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