Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

Optical Constants ◽

Interband Transitions ◽

Hybrid Perovskite ◽

Ellipsometric Study

Complex optical constants and interband transitions of a hybrid perovskite CsPbBr3 thin film measured by spectroscopic ellipsometry.

Combination of Spectroscopic Ellipsometry and Transmittance for Measuring the Optical Constants of Transparent Layers: Application to a Pyrochlore PbZr$_{0.2}$Ti$_{0.8}$O$_3$ Thin Film on a SrTiO$_3$ Substrate

New Physics Sae Mulli ◽

10.3938/npsm.61.785 ◽

2011 ◽

Vol 61 (8) ◽

pp. 785-790

Author(s):

Yu-Seong SEO ◽

Dae-Young KWON ◽

Bog-Gi KIM ◽

Jai-Seok AHN* ◽

Il-Kyoung JEONG

Keyword(s):

Thin Film ◽

Determination of optical constants of pentacene thin film by spectroscopic ellipsometry

Solar Energy Materials and Solar Cells ◽

10.1016/j.solmat.2009.10.019 ◽

2010 ◽

Vol 94 (3) ◽

pp. 420-424 ◽

Cited By ~ 9

Author(s):

Debjit Datta ◽

Satyendra Kumar

Keyword(s):

Thin Film ◽

Optical constants and interband transitions of anisotropic layered structured Tl2GaInS4 crystals by spectroscopic ellipsometry

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2012.09.103 ◽

2013 ◽

Vol 549 ◽

pp. 179-183 ◽

Cited By ~ 1

Author(s):

M. Isik ◽

N.M. Gasanly ◽

R. Turan

Keyword(s):

Optical Constants ◽

Interband Transitions

Determination of the optical constants of an inhomogeneous transparent LaF_3 thin film on a transparent substrate by spectroscopic ellipsometry

Optics Letters ◽

10.1364/ol.17.000538 ◽

1992 ◽

Vol 17 (7) ◽

pp. 538 ◽

Cited By ~ 25

Author(s):

P. Chindaudom ◽

K. Vedam

Keyword(s):

Thin Film ◽

Optical Constants ◽

Transparent Substrate

Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino) -N-methylmaleimide thin film by spectroscopic ellipsometry

The European Physical Journal Applied Physics ◽

10.1051/epjap:2005063 ◽

2005 ◽

Vol 31 (3) ◽

pp. 179-183

Author(s):

W. Xie ◽

C. Li ◽

S. Liu

Keyword(s):

Thin Film ◽

Numerical Study of the Effects of Surface Micro-roughness on the Optical Constants of Aluminum Determined by Spectroscopic Ellipsometry

Proceedings of the 15th International Heat Transfer Conference ◽

10.1615/ihtc15.rad.009382 ◽

2014 ◽

Author(s):

Wenjie Zhang ◽

Jiayue Yang ◽

Linhua Liu

Keyword(s):

Optical Constants ◽

Numerical Study

Multiple determination of the optical constants of thin-film coating materials: a Rh sequel

Applied Optics ◽

10.1364/ao.25.001299 ◽

1986 ◽

Vol 25 (8) ◽

pp. 1299 ◽

Cited By ~ 15

Author(s):

D. E. Aspnes ◽

H. G. Craighead

Keyword(s):

Thin Film ◽

Optical Constants ◽

Film Coating ◽

Thin Film Coating ◽

Coating Materials ◽

Multiple Determination

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

Crystal Research and Technology ◽

10.1002/crat.200310094 ◽

2003 ◽

Vol 38 (9) ◽

pp. 773-778 ◽

Cited By ~ 41

Author(s):

B. Karunagaran ◽

R. T. Rajendra Kumar ◽

C. Viswanathan ◽

D. Mangalaraj ◽

Sa. K. Narayandass ◽

...

Keyword(s):

Thin Films ◽

Titanium Dioxide ◽

Optical Constants ◽

Titanium Dioxide Thin Films

Corrigendum to “Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry” [Opt. Commun. 284(3), 807–812]•

Optics Communications ◽

10.1016/j.optcom.2011.03.070 ◽

2011 ◽

Vol 284 (12) ◽

pp. 3181

Keyword(s):

Thin Films ◽

Vanadium Dioxide ◽

Optical Constants ◽

Vanadium Dioxide Thin Films

Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

Procedia Engineering ◽

10.1016/j.proeng.2011.03.041 ◽

2011 ◽

Vol 8 ◽

pp. 223-227 ◽

Cited By ~ 6

Author(s):

R. Yusoh ◽

M. Horprathum ◽

P. Eiamchai ◽

S. Chanyawadee ◽

K. Aiempanakit

Keyword(s):

Spectrophotometric Method ◽