In-Situ Ellipsometric Study of the Optical Properties of LTL-Doped Thin Film Sensors for Copper(II) Ion Detection

Optical sensors fabricated in zeolite nanoparticle composite films rely on changes in their optical properties (refractive index, n, and thickness, d) to produce a measurable response in the presence of a target analyte. Here, ellipsometry is used to characterize the changes in optical properties of Linde Type L (LTL) zeolite thin films in the presence of Cu2+ ions in solution, with a view to improving the design of optical sensors that involve the change of n and/or d due to the adsorption of Cu2+ ions. The suitability of two different ellipsometry techniques (single wavelength and spectroscopic) for the evaluation of changes in n and d of both undoped and zeolite-doped films during exposure to water and Cu2+-containing solutions was investigated. The influence of pre-immersion thermal treatment conditions on sensor response was also studied. Due to the high temporal resolution, single wavelength ellipsometry facilitated the identification of a Cu2+ concentration response immediately after Cu2+ introduction, indicating that the single wavelength technique is suitable for dynamic studies of sensor–analyte interactions over short time scales. In comparison, spectroscopic ellipsometry produced a robust analysis of absolute changes in film n and d, as well as yielding insight into the net influence of competing and simultaneous changes in n and d inside the zeolite-doped films arising due to water adsorption and the ion exchange of potassium (K+) cations by copper (Cu2+).

Ellipsometric study of optical properties and oxidation processes of compacted powders based on aluminum alloys

The paper presents the results of an ellipsometric study of compacted powders of aluminum-based binary alloys containing 1,5 wt.% of rare earth elements (Sc, La, Ce, Sm) and cast aluminum-silicon alloys with the following compositions: Al–10Si–0,5Mg– 0,3Fe–0,1Ca and Al–12Si–0,6Mg–0,5Fe–0,5Ca–0,45Na. An immersion method was used to determine the optical constants of massive polycrystalline alloys obtained by remelting these powders in vacuum, as well as their oxide films for a wavelength λ = 0,6328 μm. Using the optical constants of these alloys, the dependence of their reflectivity on the surface oxide film thickness was calculated. It was found that an increase in the amount of the alloying component and intermetallic phases in the alloy decreases its reflectivity. In addition, the optical constants were used in the construction of modified Δ–ψ nomograms calculated using the Maxwell-Garnett equation that make it possible to determine the thicknesses of oxide films on particles and the volume fractions of metal in compacted powders, and to study the processes of their oxidation in air. It was shown that oxidation of aluminum ASD-4 powders and Al–1,5% REM binary alloys at 600 °C is described by a simple model where a decrease in the metal fraction leads to an increase in the oxide film thickness. It turned out that the oxidation of aluminum-silicon alloys is much faster and not described by this model, which may be due to the appearance of a liquid phase in the powder. A large number of metal droplets on the surface of particles increase the amount of metal on the studied tablet surface in general. The high oxidation rate of aluminumsilicon alloys in air can be explained by the surface activity of magnesium in relation to liquid aluminum.