Modelling of millimetre-wave receivers using an extended FDTD method

Author(s):  
S.B. Yeap
Keyword(s):  
1997 ◽  
Vol 90 (3) ◽  
pp. 495-497
Author(s):  
CLAUDIO ESPOSTI ◽  
FILIPPO TAMASSIA ◽  
CRISTINA PUZZARINI ◽  
RICCARDO TARRONI ◽  
ZDENEK ZELINGER

1997 ◽  
Vol 92 (2) ◽  
pp. 229-236 ◽  
Author(s):  
M. HEPP ◽  
R. GENDRIESCH ◽  
I. PAK ◽  
Y.A. KURITSYN ◽  
F. LEWEN ◽  
...  

1989 ◽  
Vol 136 (6) ◽  
pp. 487
Author(s):  
S.T. Peng ◽  
S.J. Xu ◽  
F.K. Schwering
Keyword(s):  

2009 ◽  
Vol 129 (10) ◽  
pp. 1225-1232 ◽  
Author(s):  
Susumu Matsuura ◽  
Akiyoshi Tatematsu ◽  
Taku Noda ◽  
Shigeru Yokoyama

2003 ◽  
Vol 783 ◽  
Author(s):  
Charles E Free

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.


2010 ◽  
Vol E93-C (8) ◽  
pp. 1323-1332 ◽  
Author(s):  
Tsunayuki YAMAMOTO ◽  
Kazuhiro FUJIMORI ◽  
Minoru SANAGI ◽  
Shigeji NOGI
Keyword(s):  

2016 ◽  
Vol E99.C (7) ◽  
pp. 817-819 ◽  
Author(s):  
Jun SHIBAYAMA ◽  
Yusuke WADA ◽  
Junji YAMAUCHI ◽  
Hisamatsu NAKANO

2014 ◽  
Vol E97.C (9) ◽  
pp. 880-887 ◽  
Author(s):  
Mingzhe RONG ◽  
Tianhui LI ◽  
Xiaohua WANG ◽  
Dingxin LIU ◽  
Anxue ZHANG

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