Conclusion: Research Issues after Structural Adjustment

2000 ◽  
pp. 181-192
Author(s):  
Meine Pieter van Dijk ◽  
Árni Sverrisson
1997 ◽  
Vol 36 (3) ◽  
pp. 300-303
Author(s):  
Naeem Akhtar

The book under review is an edited collection of eight papers presented at a seminar on “Structural Adjustment and Poverty in India: Policy and Research Issues”, and is Volume 17 in the Indo-Dutch studies on Development Alternatives. The book evaluates the impact of economic reforms on poverty alleviation in India. In the “Introduction”, the editors describe the main theme of the book and propose some policy measures for poverty alleviation in the light of the findings of the papers included in the book. The paper, “Structural Adjustment in India—What about Poverty Alleviation?”, by Pieter A. van Stuijvenberg, evaluates the impact of India’s Structural Adjustment Programme (SAP) on the poor and suggests some policy corrections to mitigate the adverse effects of this adjustment on the poor. He observes an improvement in the balance-of-payments position and foreign exchange reserves without a simultaneous fall in gross domestic product under the SAP. His major concerns are the large size and composition of fiscal deficits (dominated by revenue deficits). The large size of fiscal deficits, according to van Stuijvenberg, drive up real interest rates and endanger investment-led growth. He observes that social indicators of the social safety net, employment, and rural development programmes have not improved much due to expenditure cuts on rural infrastructural investments. He suggests a reduction in the size and composition of the public sector, elimination of all explicit and implicit subsidies, and discouraging rent-seeking behaviour for a successful implementation of economic reforms.


Author(s):  
P.E. Russell ◽  
I.H. Musselman

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.


Author(s):  
M. Rodwan Abouharb ◽  
David Cingranelli

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