Transmission electron diffraction study of C70 phase transformation at low temperature

1992 ◽  
Vol 61 (10) ◽  
pp. 1171-1173 ◽  
Author(s):  
M. Tomita ◽  
T. Hayashi ◽  
P. Gaskell ◽  
T. Maruno ◽  
T. Tanaka
Keyword(s):  
Phase Transformation ◽  
Electron Diffraction ◽  
Low Temperature ◽  
Diffraction Study ◽  
Electron Diffraction Study ◽  
Transmission Electron Diffraction ◽  
Transmission Electron

Transmission electron diffraction study of a uniaxially-ordered high-mobility polymeric semiconductor

Microscopy ◽  
2019 ◽  
Vol 68 (2) ◽  
pp. 167-173 ◽  
Author(s):  
Masayuki Sasaki ◽  
Yu Yamashita ◽  
Hiroyuki Matsui ◽  
Yoshifumi Oshima ◽  
Jun Takeya
Keyword(s):  
Electron Diffraction ◽  
Diffraction Study ◽  
High Mobility ◽  
Electron Diffraction Study ◽  
Transmission Electron Diffraction ◽  
Polymeric Semiconductor ◽  
Transmission Electron

In situ electron diffraction study of synthetic (Ca1-xSrx)2MgSi2O7 åkermanites

2000 ◽  
Vol 215 (9) ◽  
Author(s):  
H. Rager ◽  
M. Schosnig ◽  
A.K. Schaper ◽  
A. Kutoglu ◽  
W. Treutmann
Keyword(s):  
Phase Transitions ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Diffraction Study ◽  
Solid Solutions ◽  
Transmission Electron Microscope ◽  
Electron Diffraction Study ◽  
Modulated Structure ◽  
Transmission Electron

This paper deals with transmission electron microscope experiments of Ca,Sr-åkermanite solid solutions at temperatures between 100 K and 375 K. The aim of the investigations was to study the compositional and temperature dependence of phase transitions from the normal to the incommensurately modulated structure of(Ca

Electron Diffraction Study of the Phase Transformation ofα'-NaV2O5

2000 ◽  
Vol 69 (7) ◽  
pp. 1935-1938 ◽  
Author(s):  
Kenji Tsuda ◽  
Shuichi Amamiya ◽  
Michiyoshi Tanaka ◽  
Yukio Noda ◽  
Masahiko Isobe ◽  
...  
Keyword(s):  
Phase Transformation ◽  
Electron Diffraction ◽  
Diffraction Study ◽  
Electron Diffraction Study

A Low-Temperature Electron Microscopy and Electron Diffraction Study of La1.84Sr0.16CuO4

1987 ◽  
Vol 26 (Part 2, No. 10) ◽  
pp. L1714-L1717 ◽  
Author(s):  
Takashi Onozuka ◽  
Mamoru Omori ◽  
Makoto Hirabayashi ◽  
Yasuhiko Syono
Keyword(s):  
Electron Microscopy ◽  
Electron Diffraction ◽  
Low Temperature ◽  
Diffraction Study ◽  
Electron Diffraction Study ◽  
Temperature Electron
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