High frequency attenuated total internal reflection light modulator

1992 ◽  
Vol 61 (21) ◽  
pp. 2500-2502 ◽  
Author(s):  
O. Solgaard ◽  
F. Ho ◽  
J. I. Thackara ◽  
D. M. Bloom
1999 ◽  
Vol 5 (S2) ◽  
pp. 66-67
Author(s):  
Andre’ J. Sommer ◽  
Mark Hardgrove

Over the past several years many developments have taken place in the field of molecular spectroscopy. For Raman spectroscopy many of the improvements have arisen from technological innovations that include diode-based lasers, holographic notch filters and charged coupled detectors. In contrast, a majority of the developments in infrared spectroscopy have been in the area of new sampling accessories. A major emphasis has been placed on attenuated total internal reflection (ATR) accessories. The devices are allowing infrared spectroscopy to be employed in process control environments and quality control laboratories where the method is not only robust but has the advantages of limited sample preparation and/or in situ analysis.In the realm of microspectroscopy, ATR accessories have the added advantages of providing better spatial resolution, equal to or higher S/N for equivalent sample size compared to transmission measurements and most importantly the ability to collect spectra of small samples without the adverse effect of diffraction. One accessory which was developed several years ago is known as the Split-Pea.


2004 ◽  
Vol 10 (S02) ◽  
pp. 1298-1299 ◽  
Author(s):  
L. E. Lavalle ◽  
A. J. Sommer ◽  
G. M. Story ◽  
A. E. Dowery ◽  
C. Marcott

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


2013 ◽  
Vol 19 (S2) ◽  
pp. 240-241
Author(s):  
C. Ling ◽  
J.C. Williams ◽  
A.P. Evan ◽  
A.J. Sommer

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


2004 ◽  
Vol 10 (S02) ◽  
pp. 1318-1319 ◽  
Author(s):  
L. G. Tisinger ◽  
A. J. Sommer

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.


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