Near‐field scanning optical microscopy imaging of individual threading dislocations on relaxed GexSi1−xfilms

1994 ◽  
Vol 65 (3) ◽  
pp. 344-346 ◽  
Author(s):  
J. W. P. Hsu ◽  
E. A. Fitzgerald ◽  
Y. H. Xie ◽  
P. J. Silverman
1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold

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