In situ x‐ray diffraction study of the role of annealing ambient in epitaxial CoSi2 growth from Co/Ti bilayers on Si(001)

1995 ◽  
Vol 67 (11) ◽  
pp. 1597-1599 ◽  
Author(s):  
T. I. Selinder ◽  
D. J. Miller ◽  
K. E. Gray
Carbon ◽  
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Mathieu Pinault ◽  
Stéphan Rouzière ◽  
Dominique Porterat ◽  
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Neeraj Sharma ◽  
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Helen E. A. Brand ◽  
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In situ synchrotron X-ray diffraction study of the synthesis of solid-electrolyte Li1+xAlxGe2−x(PO4)3 (LAGP) from the precursor glass reveals that an initially crystallized dopant poor phase transforms into the Al-doped LAGP at 800 °C.


2021 ◽  
Vol 48 (10) ◽  
Author(s):  
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John S. Tse ◽  
Serge Desgreniers ◽  
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Yuanming Pan ◽  
...  

2018 ◽  
Vol 30 (1) ◽  
pp. 77-84 ◽  
Author(s):  
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