A low stray light, high current, low energy electron source

1999 ◽  
Vol 70 (10) ◽  
pp. 3886-3888 ◽  
Author(s):  
M. Adelt ◽  
R. Körber ◽  
W. Drachsel ◽  
H.-J. Freund

1991 ◽  
Vol 70 (8) ◽  
pp. 4050-4052 ◽  
Author(s):  
Tadashi Ohgo ◽  
Tamio Hara ◽  
Manabu Hamagaki ◽  
Kazushige Ishii ◽  
Masamoto Otsuka


1989 ◽  
Vol 9 ◽  
pp. 259-264 ◽  
Author(s):  
Y. Yamauchi ◽  
M. Fujitsuka ◽  
H. Shinno ◽  
T. Tanabe ◽  
T. Shikama ◽  
...  


2013 ◽  
Vol 19 (S2) ◽  
pp. 376-377
Author(s):  
C.-Y. Lin ◽  
I.-S. Hwang ◽  
W.-T. Chang ◽  
W.-H. Hsu ◽  
M.-T. Chang ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.



Author(s):  
Weijiang Zhao ◽  
Tomoya Manabe ◽  
Satoshi Abo ◽  
Mikio Takai


1973 ◽  
Vol 44 (6) ◽  
pp. 776-777 ◽  
Author(s):  
James A. Jahnke ◽  
M. Silver


MRS Bulletin ◽  
1995 ◽  
Vol 20 (10) ◽  
pp. 38-40 ◽  
Author(s):  
Helmut Poppa ◽  
Ernst Bauer ◽  
Heiko Pinkvos

Spin-polarized low-energy electron microscopy (SPLEEM) is a new approach to magnetic-surface imaging. Historically, it is an outgrowth of LEEM (low-energy electron microscopy), which has been successfully applied to the high-speed in situ imaging of microscopic surface structures under clean ultrahigh-vacuum (UHV) conditions. In terms of basic instrument design, in SPLEEM a spin-polarized electron source of the Pierce type replaces the LaB6 field-emission electron source used in all dedicated LEEM systems. A new, fully electrostatic version of LEEM has recently been developed, resulting in a more compact, flange-on-type instrument component, which can be integrated with standard UHV surface analytical systems. The main advantage of the new SPLEEM technique is an advanced electron-source design that allows the spin direction to be arbitrarily adjusted with respect to the sample surface (see the following).



2007 ◽  
Vol 22 (22) ◽  
pp. 4006-4012
Author(s):  
M. ZOLOTOREV ◽  
E. D. COMMINS ◽  
S. HEIFETS ◽  
F. SANNIBALE

We propose a novel scheme for a high-brightness pulsed electron source, which has the potential for many useful applications in electron microscopy, inverse photo-emission, low energy electron scattering experiments, and electron holography. A description of the proposed scheme is presented.



1998 ◽  
Vol 43 (1) ◽  
pp. 39-43 ◽  
Author(s):  
V. N. Devyatkov ◽  
N. N. Koval’ ◽  
P. M. Shchanin


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