Polarized edge-incident photovoltage spectroscopy and reflectance characterization of a GaAs/GaAlAs vertical-cavity surface-emitting laser structure
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2019 ◽
Vol 1217
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pp. 012003
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2005 ◽
Vol 23
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pp. 1428
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2005 ◽
Vol 11
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pp. 968-981
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1997 ◽