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Optical constants and thickness determination of very thin amorphous semiconductor films
Journal of Applied Physics
◽
10.1063/1.1500785
◽
2002
◽
Vol 92
(6)
◽
pp. 3093-3102
◽
Cited By ~ 42
Author(s):
I. Chambouleyron
◽
S. D. Ventura
◽
E. G. Birgin
◽
J. M. Martínez
Keyword(s):
Optical Constants
◽
Amorphous Semiconductor
◽
Semiconductor Films
◽
Thickness Determination
Download Full-text
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References
Optical constants and ellipsometric thickness determination of strained Si[sub 1−x]Ge[sub x]:C layers on Si (100) and related heterostructures
Journal of Applied Physics
◽
10.1063/1.1308070
◽
2000
◽
Vol 88
(7)
◽
pp. 4102
◽
Cited By ~ 23
Author(s):
Stefan Zollner
◽
Jill Hildreth
◽
Ran Liu
◽
P. Zaumseil
◽
M. Weidner
◽
...
Keyword(s):
Optical Constants
◽
Strained Si
◽
Thickness Determination
Download Full-text
Determination of optical constants and band gaps of bilayered semiconductor films
Vacuum
◽
10.1016/0042-207x(94)00069-7
◽
1995
◽
Vol 46
(3)
◽
pp. 309-313
◽
Cited By ~ 7
Author(s):
D Bhattacharyya
◽
S Chaudhuri
◽
AK Pal
Keyword(s):
Optical Constants
◽
Band Gaps
◽
Semiconductor Films
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Optical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative study
10.1063/1.4791196
◽
2013
◽
Author(s):
S. Jena
◽
R. B. Tokas
◽
S. Thakur
◽
N. K. Sahoo
Keyword(s):
Thin Films
◽
Comparative Study
◽
Optical Constants
◽
Synthesis Method
◽
Thickness Determination
◽
Envelope Method
Download Full-text
Optical constants for ellipsometric thickness determination of strained AlAs and InAs layers on InP
Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM)
◽
10.1109/iciprm.1994.328177
◽
2002
◽
Author(s):
C.M. Herzinger
◽
P.G. Snyder
◽
F.G. Celii
◽
Y.-C. Kao
◽
B. Johs
◽
...
Keyword(s):
Optical Constants
◽
Thickness Determination
Download Full-text
Comparison of Science-Based Calibration (SBC) and PLS for In-Line Coating Thickness Determination of White and Colored Tablets Using Raman Spectroscopy
10.26226/morressier.57d6b2b7d462b8028d88e477
◽
2016
◽
Author(s):
Shirin Barimani
Keyword(s):
Raman Spectroscopy
◽
Coating Thickness
◽
Thickness Determination
Download Full-text
Determination of Spectral Optical Constants of Glazings by Numerical Integration from FTIR Spectrometer Measurements
10.26678/abcm.cobem2019.cob2019-2253
◽
2019
◽
Author(s):
Santiago Riquelme
◽
Nathan Mendes
◽
Luís Mauro Moura
Keyword(s):
Numerical Integration
◽
Optical Constants
◽
Ftir Spectrometer
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Determination of the optical constants of metal-halide perovskite nanocrystals
10.29363/nanoge.nipho.2020.038
◽
2019
◽
Author(s):
Gabriel Lozano
◽
Andrea Rubino
◽
Mauricio E. Calvo
◽
Hernán Míguez
Keyword(s):
Optical Constants
◽
Metal Halide
◽
Perovskite Nanocrystals
◽
Metal Halide Perovskite
◽
Halide Perovskite
Download Full-text
Multiple determination of the optical constants of thin-film coating materials: a Rh sequel
Applied Optics
◽
10.1364/ao.25.001299
◽
1986
◽
Vol 25
(8)
◽
pp. 1299
◽
Cited By ~ 15
Author(s):
D. E. Aspnes
◽
H. G. Craighead
Keyword(s):
Thin Film
◽
Optical Constants
◽
Film Coating
◽
Thin Film Coating
◽
Coating Materials
◽
Multiple Determination
Download Full-text
Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions
Journal of Electronic Materials
◽
10.1007/s11664-006-0324-5
◽
2006
◽
Vol 35
(12)
◽
pp. 2142-2146
◽
Cited By ~ 2
Author(s):
J. Joshua Yang
◽
Chengxiang Ji
◽
Ying Yang
◽
Y. Austin Chang
◽
Feng X. Liu
◽
...
Keyword(s):
Tunnel Junctions
◽
Oxide Films
◽
Magnetic Tunnel Junctions
◽
Thickness Determination
◽
Ultrathin Oxide Films
◽
Ultrathin Oxide
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Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method
Procedia Engineering
◽
10.1016/j.proeng.2011.03.041
◽
2011
◽
Vol 8
◽
pp. 223-227
◽
Cited By ~ 6
Author(s):
R. Yusoh
◽
M. Horprathum
◽
P. Eiamchai
◽
S. Chanyawadee
◽
K. Aiempanakit
Keyword(s):
Spectroscopic Ellipsometry
◽
Spectrophotometric Method
◽
Optical Constants
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