Investigation of indium distribution in InGaAs∕GaAs quantum dot stacks using high-resolution x-ray diffraction and Raman scattering

2006 ◽  
Vol 99 (2) ◽  
pp. 023517 ◽  
Author(s):  
Yu. I. Mazur ◽  
Zh. M. Wang ◽  
G. J. Salamo ◽  
V. V. Strelchuk ◽  
V. P. Kladko ◽  
...  
Keyword(s):  
High Resolution ◽  
Quantum Dot ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gaas Quantum Dot

Evaluation of strain balancing layer thickness for InAs/GaAs quantum dot arrays using high resolution x-ray diffraction and photoluminescence

2009 ◽  
Vol 95 (20) ◽  
pp. 203110 ◽  
Author(s):  
Christopher G. Bailey ◽  
Seth M. Hubbard ◽  
David V. Forbes ◽  
Ryne P. Raffaelle
Keyword(s):  
High Resolution ◽  
Quantum Dot ◽  
Layer Thickness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gaas Quantum Dot

High‐resolution x‐ray diffraction of self‐organized InGaAs/GaAs quantum dot structures

1996 ◽  
Vol 68 (6) ◽  
pp. 785-787 ◽  
Author(s):  
A. Krost ◽  
F. Heinrichsdorff ◽  
D. Bimberg ◽  
A. Darhuber ◽  
G. Bauer
Keyword(s):  
High Resolution ◽  
Quantum Dot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Organized ◽  
Gaas Quantum Dot

Quantitative analysis of the quantum dot superlattice by high-resolution x-ray diffraction

2013 ◽  
Vol 113 (16) ◽  
pp. 163506 ◽  
Author(s):  
N. N. Faleev ◽  
C. Honsberg ◽  
V. I. Punegov
Keyword(s):  
Quantitative Analysis ◽  
High Resolution ◽  
Quantum Dot ◽  
X Ray Diffraction ◽  
X Ray

Anomalous x-ray diffraction on InAs/GaAs quantum dot systems

2002 ◽  
Vol 81 (3) ◽  
pp. 448-450 ◽  
Author(s):  
T. U. Schülli ◽  
M. Sztucki ◽  
V. Chamard ◽  
T. H. Metzger ◽  
D. Schuh
Keyword(s):  
Quantum Dot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gaas Quantum Dot

Internal distortion in ceria-doped hafnia solid solutions: High-resolution x-ray diffraction and Raman scattering

2001 ◽  
Vol 64 (13) ◽  
Author(s):  
Hirotaka Fujimori ◽  
Masatomo Yashima ◽  
Satoshi Sasaki ◽  
Masato Kakihana ◽  
Takeharu Mori ◽  
...  
Keyword(s):  
High Resolution ◽  
Raman Scattering ◽  
Solid Solutions ◽  
X Ray Diffraction ◽  
X Ray

High Resolution X-Ray Diffraction and Raman Scattering Studies of Cubic-Phase InN Films Grown by MBE

2008 ◽  
Vol 55-57 ◽  
pp. 773-776 ◽  
Author(s):  
S. Kuntharin ◽  
S. Sanorpim ◽  
Hiroyuki Yaguchi ◽  
Y. Iwahashi ◽  
M. Orihara ◽  
...  
Keyword(s):  
High Resolution ◽  
Raman Scattering ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals X-ray diffraction and optical characterization of interdiffusion in self-assembled InAs/GaAs quantum-dot superlattices

2000 ◽  
Vol 77 (14) ◽  
pp. 2130-2132 ◽  
Author(s):  
S. J. Xu ◽  
H. Wang ◽  
Q. Li ◽  
M. H. Xie ◽  
X. C. Wang ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Optical Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled ◽  
Gaas Quantum Dot

In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution

2011 ◽  
Vol 98 (21) ◽  
pp. 213105 ◽  
Author(s):  
M. Dubslaff ◽  
M. Hanke ◽  
M. Burghammer ◽  
S. Schöder ◽  
R. Hoppe ◽  
...  
Keyword(s):  
High Resolution ◽  
Quantum Dot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Quantum Dot Molecules

High-resolution X-ray diffraction and micro-Raman scattering studies of Ge(:Ga) thin films grown on GaAs (001) substrates by MOCVD

RSC Advances ◽  
2016 ◽  
Vol 6 (58) ◽  
pp. 52575-52582 ◽  
Author(s):  
H. F. Liu ◽  
Y. J. Jin ◽  
C. G. Li ◽  
S. B. Dolmanan ◽  
S. Guo ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Raman Scattering ◽  
Cross Section ◽  
X Ray Diffraction ◽  
X Ray

Ga-doped Ge thin films grown on GaAs (001) substrates have been studied and compared with unintentionally doped Ge film by using HRXRD and Raman scattering in both surface and cross-section configurations.

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