An improved wedge calibration method for lateral force in atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.1584082 ◽

2003 ◽

Vol 74 (7) ◽

pp. 3362-3367 ◽

Author(s):

M. Varenberg ◽

I. Etsion ◽

G. Halperin

Keyword(s):

Atomic Force Microscopy ◽

Calibration Method ◽

Lateral Force ◽

Force Microscopy ◽

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Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

Review of Scientific Instruments ◽

10.1063/1.2198768 ◽

2006 ◽

Vol 77 (5) ◽

pp. 053701 ◽

Author(s):

Rachel J. Cannara ◽

Michael Eglin ◽

Robert W. Carpick

Keyword(s):

Atomic Force Microscopy ◽

Calibration Method ◽

Lateral Force ◽

Force Microscopy ◽

Atomic Force ◽

Force Calibration

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Tribological analysis of glass fibers using atomic force microscopy (AFM)/lateral force microscopy (LFM)

Journal of Applied Polymer Science ◽

10.1002/(sici)1097-4628(20000222)75:8<1013::aid-app6>3.0.co;2-y ◽

2000 ◽

Vol 75 (8) ◽

pp. 1013-1025 ◽

Author(s):

N. Behary ◽

A. Ghenaim ◽

A. El Achari ◽

C. Caze

Keyword(s):

Atomic Force Microscopy ◽

Glass Fibers ◽

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Tribological Analysis

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Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

Tribology Letters ◽

10.1007/s11249-020-01349-y ◽

2020 ◽

Vol 68 (4) ◽

Author(s):

Arnab Bhattacharjee ◽

Nikolay T. Garabedian ◽

Christopher L. Evans ◽

David L. Burris

Keyword(s):

Atomic Force Microscopy ◽

Lateral Force ◽

Force Microscopy ◽

Atomic Force ◽

Force Calibration

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Calibration method of curvature distortion in step height measurement by atomic force microscopy

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/715/1/012056 ◽

2020 ◽

Vol 715 ◽

pp. 012056

Author(s):

Wei Li ◽

Xixi Yu ◽

Sitian Gao ◽

Yushu Shi ◽

Shi Li ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Calibration Method ◽

Step Height ◽

Height Measurement ◽

Force Microscopy ◽

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Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2015.10.028 ◽

2016 ◽

Vol 161 ◽

pp. 41-50 ◽

Author(s):

Bien Cuong Tran Khac ◽

Koo-Hyun Chung

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Assessment ◽

Lateral Force ◽

Force Microscopy ◽

Atomic Force ◽

Calibration Methods ◽

Force Calibration

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A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films

Review of Scientific Instruments ◽

10.1063/1.3136908 ◽

2009 ◽

Vol 80 (5) ◽

pp. 055109 ◽

Author(s):

Ralf Brunner ◽

Izhak Etsion ◽

Frank E. Talke

Keyword(s):

Atomic Force Microscopy ◽

Surface Energy ◽

Direct Measurement ◽

Calibration Method ◽

Liquid Films ◽

Thin Liquid Films ◽

Nanostructured Surfaces ◽

Force Microscopy ◽

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Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection

Japanese Journal of Applied Physics ◽

10.1143/jjap.38.3958 ◽

1999 ◽

Vol 38 (Part 1, No. 6B) ◽

pp. 3958-3961 ◽

Author(s):

Masami Kageshima ◽

Hisato Ogiso ◽

Shizuka Nakano ◽

Mark A. Lantz ◽

Hiroshi Tokumoto

Keyword(s):

Atomic Force Microscopy ◽

Lateral Force ◽

Force Detection ◽

Force Microscopy ◽

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Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589161 ◽

1996 ◽

Vol 14 (2) ◽

pp. 856 ◽

Author(s):

R. Linnemann

Keyword(s):

Atomic Force Microscopy ◽

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Piezoresistive Cantilevers

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3K1112 Measurements of intracellular calcium in response to lateral force by atomic force microscopy(Cell biology 3,The 49th Annual Meeting of the Biophysical Society of Japan)

Seibutsu Butsuri ◽

10.2142/biophys.51.s145_2 ◽

2011 ◽

Vol 51 (supplement) ◽

pp. S145

Author(s):

Jumpei Sato ◽

Yusuke Mizutani ◽

Koichi Kawahara ◽

Takaharu Okajima

Keyword(s):

Atomic Force Microscopy ◽

Intracellular Calcium ◽

Annual Meeting ◽

Cell Biology ◽

Lateral Force ◽

Force Microscopy ◽

Atomic Force ◽

Biophysical Society

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Measurement of Frictional Forces in Atomic Force Microscopy

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.121-123.851 ◽

2007 ◽

Vol 121-123 ◽

pp. 851-854 ◽

Author(s):

D.H. Choi ◽

W. Hwang

Keyword(s):

Atomic Force Microscopy ◽

Conversion Factor ◽

Calibration Method ◽

Adhesive Force ◽

Torsional Angle ◽

Force Microscopy ◽

Atomic Force ◽

Force Moment ◽

Frictional Forces ◽

The Relationship

A new calibration method of frictional forces in atomic force microscopy (AFM) is suggested. An angle conversion factor is defined using the relationship between torsional angle and frictional signal. When the factor is measured, the slopes of the torsional angle and the frictional signal as a function of the normal force are used to eliminate the effect of the adhesive force. Moment balance equations on the flat surface and the top edge of a commercial step grating are used to obtain the angle conversion factor. After the factor is obtained from an AFM system, it can be applied to all cantilevers without additional experiments.

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