Real-time monitoring of organic vapor-phase deposition of molecular thin films using high-pressure reflection high-energy electron diffraction
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1999 ◽
Vol 203
(3)
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pp. 412-420
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1995 ◽
Vol 156
(1-2)
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pp. 91-98
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2013 ◽
Vol 56
(12)
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pp. 2312-2326
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