Growth and in situ high-pressure reflection high energy electron diffraction monitoring of oxide thin films
2013 ◽
Vol 56
(12)
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pp. 2312-2326
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2015 ◽
pp. 3-29
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1994 ◽
Vol 137
(1-2)
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pp. 187-194
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1998 ◽
Vol 16
(3)
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pp. 1507
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2011 ◽
pp. 180-211
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