Dual nonlinear dielectric resonance and strong natural resonance in Ni/ZnO nanocapsules

2009 ◽  
Vol 94 (5) ◽  
pp. 053119 ◽  
Author(s):  
X. G. Liu ◽  
J. J. Jiang ◽  
D. Y. Geng ◽  
B. Q. Li ◽  
Z. Han ◽  
...  
Keyword(s):  
Nonlinear Dielectric ◽  
Dielectric Resonance ◽  
Natural Resonance

Multiple nonlinear dielectric resonance of ultra-long silver trimolybdate nanowires

2013 ◽  
Vol 202 ◽  
pp. 320-323 ◽  
Author(s):  
Guang-Sheng Wang ◽  
Bo Wen ◽  
Shuai He ◽  
Lin Guo ◽  
Mao-Sheng Cao
Keyword(s):  
Nonlinear Dielectric ◽  
Dielectric Resonance

Metal-Dielectric Resonance Absorbing Diffraction Gratingsin the Optical Range

2016 ◽  
Vol 5 (5) ◽  
pp. 90-98
Author(s):  
I.N. Ivanova ◽  
◽  
A.B. Kleschenkov ◽  
A.M. Lerer ◽  
V.V. Makhno ◽  
...  
Keyword(s):  
Optical Range ◽  
Dielectric Resonance

Carrier Redistribution Analysis of Gate-Biased SiC Power-MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy

2015 ◽  
Author(s):  
Norimichi Chinone ◽  
Yasuo Cho
Keyword(s):  
Cross Section ◽  
Measurement System ◽  
Higher Order ◽  
Depletion Layer ◽  
Gate Bias ◽  
Power Mosfet ◽  
Nonlinear Dielectric ◽  
Voltage Dependent ◽  
Carrier Redistribution ◽  
Source Voltage

Abstract Gate-bias dependent depletion layer distribution and carrier distributions in cross-section of SiC power MOSFET were measured by newly developed measurement system based on super-higher-order scanning nonlinear dielectric microscope. The results visualized gate-source voltage dependent redistribution of depletion layer and carrier.

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