Threshold switching in chalcogenide‐glass thin films

1980 ◽  
Vol 51 (6) ◽  
pp. 3289-3309 ◽  
Author(s):  
D. Adler ◽  
M. S. Shur ◽  
M. Silver ◽  
S. R. Ovshinsky
1984 ◽  
Vol 56 (2) ◽  
pp. 579-580 ◽  
Author(s):  
D. Adler ◽  
M. S. Shur ◽  
M. Silver ◽  
S. R. Ovshinsky

1991 ◽  
pp. 66-87
Author(s):  
D. Adler ◽  
M. S. Shur ◽  
M. Silver ◽  
S. R. Ovshinsky

2021 ◽  
Vol 9 (1) ◽  
pp. 117-126
Author(s):  
Jonas Keukelier ◽  
Karl Opsomer ◽  
Thomas Nuytten ◽  
Stefanie Sergeant ◽  
Wouter Devulder ◽  
...  

Raman spectroscopy and electrical measurements are performed on sputtered GexSe1−x thin films to identify and link bond presence to electrical behaviour.


2017 ◽  
Vol 111 (25) ◽  
pp. 252102 ◽  
Author(s):  
Guangyu Liu ◽  
Liangcai Wu ◽  
Zhitang Song ◽  
Yan Liu ◽  
Tao Li ◽  
...  

2019 ◽  
Vol 14 (5) ◽  
pp. 1900548 ◽  
Author(s):  
Anthonin Verdy ◽  
Francesco d'Acapito ◽  
Jean-Baptiste Dory ◽  
Gabriele Navarro ◽  
Mathieu Bernard ◽  
...  

Author(s):  
Andrei M. Andriesh ◽  
Francesco Michelotti ◽  
Valentin N. Ciumash ◽  
Mario Bertolotti

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