scholarly journals A new technique for observing the amorphous to crystalline transformation in thin surface layers on silicon wafers

1980 ◽  
Vol 51 (8) ◽  
pp. 4106-4110 ◽  
Author(s):  
B. Drosd ◽  
J. Washburn
2005 ◽  
Vol 25 (1_suppl) ◽  
pp. S543-S543
Author(s):  
Satoshi Kimura ◽  
Keigo Matsumoto ◽  
Yoshio Imahori ◽  
Katsuyoshi Mineura ◽  
Toshiyuki Itoh

2009 ◽  
Vol 56 (S 01) ◽  
Author(s):  
J Bickenbach ◽  
R Rossaint ◽  
R Autschbach ◽  
R Dembinski

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