A new technique for observing the amorphous to crystalline transformation in thin surface layers on silicon wafers
1980 ◽
Vol 51
(8)
◽
pp. 4106-4110
◽
1971 ◽
Vol 19
(9)
◽
pp. 350-352
◽
G.L. Schnable
◽
A.F. McKelvey
2012 ◽
Vol 2012
◽
pp. 314-315
2001 ◽
Vol 9
(1)
◽
pp. 53-58
1982 ◽
Vol 16
(1)
◽
pp. 38-46
2001 ◽
Vol 34
(0)
◽
pp. 228
2005 ◽
Vol 25
(1_suppl)
◽
pp. S543-S543
Satoshi Kimura
◽
Keigo Matsumoto
◽
Yoshio Imahori
◽
Katsuyoshi Mineura
◽
Toshiyuki Itoh
1967 ◽
Vol 46
(7)
◽
pp. 443
J Bickenbach
◽
R Rossaint
◽
R Autschbach
◽
R Dembinski