Use of transient capacitance measurements for direct determination of minority‐carrier lifetime in low‐doped metal‐oxide‐semiconductor structures

1984 ◽  
Vol 45 (1) ◽  
pp. 52-53 ◽  
Author(s):  
U. Efron ◽  
P. O. Braatz
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Direct Determination ◽  
Minority Carrier Lifetime ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Capacitance Measurements ◽  
Semiconductor Structures ◽  
Transient Capacitance

Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method

2018 ◽  
Vol 39 (4) ◽  
pp. 552-555 ◽  
Author(s):  
Maitreya Dutta ◽  
Saptarshi Mandal ◽  
Raghuraj Hathwar ◽  
Alec M. Fischer ◽  
Franz A. M. Koeck ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Recovery Method

scholarly journals Study of Photoluminescence Decay by Time-correlated Single Photon Counting for the Determination of the Minority-carrier Lifetime in Silicon

2014 ◽  
Vol 55 ◽  
pp. 121-127 ◽  
Author(s):  
Stéphanie Parola ◽  
Mehdi Daanoune ◽  
Alexandru Focsa ◽  
Bachir Semmache ◽  
Erwann Picard ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Single Photon ◽  
Photon Counting ◽  
Minority Carrier Lifetime ◽  
Single Photon Counting ◽  
Photoluminescence Decay
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