Study of various types of diamonds by measurements of double crystal x‐ray diffraction and positron annihilation

Journal of Applied Physics ◽

10.1063/1.360242 ◽

1995 ◽

Vol 78 (3) ◽

pp. 1510-1513 ◽

Author(s):

S. Fujii ◽

Y. Nishibayashi ◽

S. Shikata ◽

A. Uedono ◽

S. Tanigawa

Keyword(s):

Positron Annihilation ◽

X Ray Diffraction ◽

Double Crystal ◽

Download Full-text

Characterization of diamond single crystals by means of double-crystal X-ray diffraction and positron annihilation

Applied Physics A ◽

10.1007/bf01538199 ◽

1995 ◽

Vol 61 (3) ◽

pp. 331-333 ◽

Author(s):

S. Fujii ◽

Y. Nishibayashi ◽

S. Shikata ◽

A. Uedono ◽

S. Tanigawa

Keyword(s):

Single Crystals ◽

Positron Annihilation ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Diamond Single Crystals

Download Full-text

Characterization of diamond single crystals by means of double-crystal X-ray diffraction and positron annihilation

Applied Physics A ◽

10.1007/s003390050208 ◽

1995 ◽

Vol 61 (3) ◽

pp. 331-333 ◽

Author(s):

S. Fujii ◽

Y. Nishibayashi ◽

S. Shikata ◽

A. Uedono ◽

S. Tanigawa

Keyword(s):

Single Crystals ◽

Positron Annihilation ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Diamond Single Crystals

Download Full-text

X-RAY DIFFRACTION AND POSITRON ANNIHILATION LIFE-TIME SPECTROSCOPY STUDIES OF POLYMETALLOORGANOSILOXANES

Журнал структурной химии ◽

10.15372/jsc20160312 ◽

2016 ◽

Keyword(s):

Positron Annihilation ◽

Life Time ◽

X Ray Diffraction ◽

X Ray ◽

Spectroscopy Studies

Download Full-text

Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

Journal of Crystal Growth ◽

10.1016/0022-0248(94)90099-x ◽

1994 ◽

Vol 141 (1-2) ◽

pp. 103-108

Author(s):

X.F. Duan ◽

K.K. Fung ◽

Y.M. Chu

Keyword(s):

Strain State ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

Download Full-text

Nanocrystalline Spinel Mn$_{x}$Cu$_{1 - x}$Fe$_{2}$O$_{4}$ Ferrites—Synthesis and Structural Elucidation Using X-Ray Diffraction and Positron Annihilation Techniques

IEEE Transactions on Magnetics ◽

10.1109/tmag.2009.2031109 ◽

2010 ◽

Vol 46 (3) ◽

pp. 847-851 ◽

Author(s):

P. Predeep ◽

Arun S. Prasad ◽

S. N. Dolia ◽

M. S. Dhawan ◽

D. Das ◽

...

Keyword(s):

Positron Annihilation ◽

Structural Elucidation ◽

X Ray Diffraction ◽

Download Full-text

Characterization of Lattice Damage in Ion Implanted Silicon: Monte Carlo Simulation Combined with Double Crystal X-Ray Diffraction

phys stat sol (a) ◽

10.1002/pssa.2210910254 ◽

1985 ◽

Vol 91 (2) ◽

pp. K125-K127 ◽

Author(s):

F. Cembali ◽

A. M. Mazzone ◽

M. Servidori

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Lattice Damage ◽

Download Full-text

Double-Crystal x-Ray Diffraction Study on Ta/Al Multilayers

Chinese Physics Letters ◽

10.1088/0256-307x/9/11/011 ◽

1992 ◽

Vol 9 (11) ◽

pp. 605-608

Author(s):

Xiu Lisong ◽

Yuan Xiangyang ◽

Wu Ziqin ◽

Jiang Shusheng ◽

Hu An ◽

...

Keyword(s):

Diffraction Study ◽

X Ray Diffraction ◽

Double Crystal ◽

Download Full-text

Strain relaxation studied by photoluminescence and by double crystal X-ray diffraction measurements in strained InGaAs

Materials Science and Engineering B ◽

10.1016/0921-5107(94)90248-8 ◽

1994 ◽

Vol 22 (2-3) ◽

pp. 222-226 ◽

Author(s):

A. Tabata ◽

T. Benyattou ◽

G. Guillot ◽

S.A. Clark ◽

J.E. Macdonald ◽

...

Keyword(s):

Strain Relaxation ◽

X Ray Diffraction ◽

Double Crystal ◽

Download Full-text

Molecular Mobility of Amorphous Chain Segments of Ethylene−Methyl Methacrylate Copolymer Films as a Function of Temperature Estimated by Positron Annihilation, X-ray Diffraction, and13C NMR

Macromolecules ◽

10.1021/ma021543r ◽

2003 ◽

Vol 36 (21) ◽

pp. 8056-8065 ◽

Author(s):

Lin Ma ◽

Chunqing He ◽

Takenori Suzuki ◽

Mami Azuma ◽

Yuezhen Bin ◽

...

Keyword(s):

Methyl Methacrylate ◽

Positron Annihilation ◽

Molecular Mobility ◽

X Ray Diffraction ◽

X Ray ◽

Copolymer Films ◽

Methacrylate Copolymer

Download Full-text

High Resolution Double-Crystal X-ray Diffraction Imaging for Interfacial Defect Detection in Bonded Wafers.

ECS Meeting Abstracts ◽

10.1149/ma2012-02/40/2986 ◽

2012 ◽

Keyword(s):

High Resolution ◽

Defect Detection ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Interfacial Defect ◽

Diffraction Imaging

Download Full-text