Grain boundary microstructure and transport critical current density in YBa2Cu3Ox

1992 ◽  
Author(s):  
Donglu Shi ◽  
Yufei Gao ◽  
A. C. Biondo ◽  
J. G. Chen ◽  
K. L. Merkle ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Transport Critical Current Density ◽  
Boundary Microstructure

Facet Topography and Dislocation Structure as a Possible Source for Electrical Heterogeneity in [001] TILT Bicrystals of YBa2Cu3O7-δ

1996 ◽  
Vol 54 ◽  
pp. 338-339
Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Electromagnetic Properties ◽  
Length Scale ◽  
Density Values ◽  
Current Densities ◽  
Applied Fields ◽  
A Current

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

Enhanced transport critical current density in Sn-added SmFeAsO1−xFxtapes prepared by the PIT method

2017 ◽  
Vol 30 (6) ◽  
pp. 065004 ◽  
Author(s):  
Qianjun Zhang ◽  
Xianping Zhang ◽  
Chao Yao ◽  
He Huang ◽  
Dongliang Wang ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Transport Critical Current Density

Degradation of YBC critical current as a result of annealing in air

1993 ◽  
Vol 8 (5) ◽  
pp. 943-944 ◽  
Author(s):  
Judith Bransky
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Standard Method ◽  
Transport Critical Current Density ◽  
Ceramic Ybco

The present study was aimed at determining the rate of degradation of the transport critical current density Jc of ceramic YBCO stored in atmosphere, as a function of temperature. The transport critical current of ring-shaped samples was measured by the inductance technique. The samples were prepared by the standard method. The results show that annealing at 100 °C for over 500 h caused practically no degradation of Jc. Above 100 °C the rate of degradation increases rapidly with temperature.

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