Investigating the momentum balance of a plasma pinch: An air-side stereoscopic imaging system for locating probes

2014 ◽  
Vol 85 (10) ◽  
pp. 103509
Author(s):  
Jason Sears ◽  
T. P. Intrator ◽  
Y. Feng ◽  
H. O. Swan ◽  
J. Klarenbeek ◽  
...  
Keyword(s):  
Imaging System ◽  
Momentum Balance ◽  
Stereoscopic Imaging ◽  
Plasma Pinch

A stereoscopic imaging system for laser back-scatter-based trajectory measurement in ballistics

2010 ◽  
Author(s):  
Eugen Wilhelm ◽  
Uwe Chalupka ◽  
Cornelius Hahlweg ◽  
Wenjing Zhao ◽  
Hendrik Rothe
Keyword(s):  
Imaging System ◽  
Stereoscopic Imaging ◽  
Trajectory Measurement

LCD-based stereoscopic imaging system

2006 ◽  
Author(s):  
Jung-Young Son ◽  
V. I. Bobrinev ◽  
Yong-Jin Choi ◽  
Kyung-Hoon Cha ◽  
Min-Chul Park ◽  
...  
Keyword(s):  
Imaging System ◽  
Stereoscopic Imaging

Stereoscopic Imaging System Using Interference Color of Retarder Films

Optik ◽  
2018 ◽  
Vol 156 ◽  
pp. 914-920
Author(s):  
Kenji Harada ◽  
Toshiki Matsuzaki ◽  
Huangyi Qin
Keyword(s):  
Imaging System ◽  
Stereoscopic Imaging ◽  
Interference Color

A new concept of stereoscopic imaging system using single optical channel and a deflector: pilot study

2014 ◽  
Author(s):  
Won Hyuk Jang ◽  
Heesung Kang ◽  
Taeyoon Son ◽  
Jihoon Park ◽  
Eunkwon Jun ◽  
...  
Keyword(s):  
Pilot Study ◽  
Imaging System ◽  
Optical Channel ◽  
Stereoscopic Imaging

New Aspects in the Design of Electron Optical Magnification Systems

1972 ◽  
Vol 30 ◽  
pp. 606-607
Author(s):  
Willem H.J. Andersen
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Chromatic Aberration ◽  
Research Tool ◽  
Energy Losses ◽  
Objective Lens ◽  
Theoretical Limit ◽  
Optical Magnification ◽  
Chromatic Aberrations ◽  
High Degree

Electron microscope design, and particularly the design of the imaging system, has reached a high degree of perfection. Present objective lenses perform up to their theoretical limit, while the whole imaging system, consisting of three or four lenses, provides very wide ranges of magnification and diffraction camera length with virtually no distortion of the image. Evolution of the electron microscope in to a routine research tool in which objects of steadily increasing thickness are investigated, has made it necessary for the designer to pay special attention to the chromatic aberrations of the magnification system (as distinct from the chromatic aberration of the objective lens). These chromatic aberrations cause edge un-sharpness of the image due to electrons which have suffered energy losses in the object.There exist two kinds of chromatic aberration of the magnification system; the chromatic change of magnification, characterized by the coefficient Cm, and the chromatic change of rotation given by Cp.

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