scholarly journals Electrode-stress-induced nanoscale disorder in Si quantum electronic devices

APL Materials ◽  
2016 ◽  
Vol 4 (6) ◽  
pp. 066102 ◽  
Author(s):  
J. Park ◽  
Y. Ahn ◽  
J. A. Tilka ◽  
K. C. Sampson ◽  
D. E. Savage ◽  
...  
2018 ◽  
Vol 20 (7) ◽  
pp. 4864-4878 ◽  
Author(s):  
Jiahao Chen ◽  
Thomas J. Giroux ◽  
Yen Nguyen ◽  
Atte A. Kadoma ◽  
Boyce S. Chang ◽  
...  

Charge transport across large area molecular tunneling junctions is widely studied due to its potential in the development of quantum electronic devices.


Sign in / Sign up

Export Citation Format

Share Document