scholarly journals Invited Article: An active terahertz polarization converter employing vanadium dioxide and a metal wire grating in total internal reflection geometry

APL Photonics ◽  
2018 ◽  
Vol 3 (5) ◽  
pp. 051604 ◽  
Author(s):  
Xudong Liu ◽  
Xuequan Chen ◽  
Edward P. J. Parrott ◽  
Chunrui Han ◽  
Georges Humbert ◽  
...  
Keyword(s):  
Vanadium Dioxide ◽  
Total Internal Reflection ◽  
Internal Reflection ◽  
Metal Wire ◽  
Polarization Converter ◽  
Reflection Geometry ◽  
Wire Grating

Exploiting a metal wire grating in total internal reflection geometry to achieve achromatic polarization conversion

2017 ◽  
Vol 5 (4) ◽  
pp. 299 ◽  
Author(s):  
Xudong Liu ◽  
Xuequan Chen ◽  
Edward P. J. Parrott ◽  
Emma Pickwell-MacPherson
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Metal Wire ◽  
Polarization Conversion ◽  
Reflection Geometry ◽  
Wire Grating

scholarly journals Low-voltage driven graphene-loaded metal wire grating device in total internal reflection geometry for broadband THz modulation

2021 ◽  
Vol 14 (2) ◽  
pp. 44-51
Author(s):  
Xudong Liu ◽  
Hao Chen ◽  
Teng Li ◽  
Yiwen Sun
Keyword(s):  
Phase Modulation ◽  
Total Internal Reflection ◽  
Communication Systems ◽  
Low Voltage ◽  
Internal Reflection ◽  
Metal Wire ◽  
Resonance Effects ◽  
Electromagnetic Resonance ◽  
Reflection Geometry ◽  
Wire Grating

Terahertz modulators with capability of both intensity and phase are essential for THz imaging and communication systems. The low-voltage driven THz modulation technique is crucial for integrating the modulators with electronics components. There is still a lack of broadband devices able to achieve both amplitude and phase modulation with low voltage, due to the underlying physics behind existing approaches. Here, we demonstrate a graphene-loaded metal wire grating THz modulator in the total internal reflection geometry to achieve intensity modulation of 80% and phase modulation of 70 degree within 3 volts gate voltage. Quite different from using the strategy of metamaterials based on the electromagnetic resonance effects, our design has performed a broadband modulation for over 1 THz bandwidth.

scholarly journals Graphene-loaded metal wire grating for deep and broadband THz modulation in total internal reflection geometry

2018 ◽  
Vol 6 (12) ◽  
pp. 1151 ◽  
Author(s):  
Yiwen Sun ◽  
Riccardo Degl’Innocenti ◽  
David A. Ritchie ◽  
Harvey E. Beere ◽  
Long Xiao ◽  
...  
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Metal Wire ◽  
Reflection Geometry ◽  
Wire Grating

Total internal reflection geometry for near-field imaging

2020 ◽  
Author(s):  
Lauren E. Barr ◽  
Peter Karlsen ◽  
Samuel H. Hornett ◽  
Ian R. Hooper ◽  
Christopher R. Lawrence ◽  
...  
Keyword(s):  
Total Internal Reflection ◽  
Near Field ◽  
Internal Reflection ◽  
Near Field Imaging ◽  
Reflection Geometry ◽  
Field Imaging

scholarly journals Giant Terahertz-Wave Absorption by Monolayer Graphene in a Total Internal Reflection Geometry

ACS Photonics ◽  
2016 ◽  
Vol 4 (1) ◽  
pp. 121-126 ◽  
Author(s):  
Yoichi Harada ◽  
Muhammad Shoufie Ukhtary ◽  
Minjie Wang ◽  
Sanjay K. Srinivasan ◽  
Eddwi H. Hasdeo ◽  
...  
Keyword(s):  
Total Internal Reflection ◽  
Terahertz Wave ◽  
Internal Reflection ◽  
Monolayer Graphene ◽  
Wave Absorption ◽  
Reflection Geometry

scholarly journals Extrinsic Absorption Pathways in Vanadium‐Doped SiC Measured Using a Total Internal Reflection Geometry

2020 ◽  
Vol 217 (20) ◽  
pp. 2000315
Author(s):  
Noah J. Kramer ◽  
Lars F. Voss ◽  
Adam M. Conway ◽  
Paulius V. Grivickas ◽  
Mihail Bora ◽  
...  
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Reflection Geometry ◽  
Absorption Pathways ◽  
Extrinsic Absorption

A device for surface study of confined micron thin films in a total internal reflection geometry

2002 ◽  
Vol 73 (6) ◽  
pp. 2321-2324 ◽  
Author(s):  
Sergey Mamedov ◽  
Alexander D. Schwab ◽  
Ali Dhinojwala
Keyword(s):  
Thin Films ◽  
Total Internal Reflection ◽  
Internal Reflection ◽  
Surface Study ◽  
Reflection Geometry

scholarly journals Total Internal Reflection Geometry: Exploiting Total Internal Reflection Geometry for Terahertz Devices and Enhanced Sample Characterization (Advanced Optical Materials 3/2020)

2020 ◽  
Vol 8 (3) ◽  
pp. 2070012
Author(s):  
Qiushuo Sun ◽  
Xuequan Chen ◽  
Xudong Liu ◽  
Rayko I. Stantchev ◽  
Emma Pickwell‐MacPherson
Keyword(s):  
Total Internal Reflection ◽  
Optical Materials ◽  
Internal Reflection ◽  
Sample Characterization ◽  
Reflection Geometry ◽  
Terahertz Devices
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