Scanning electron microscope investigation of electric activity of stacking faults in silicon epitaxial layer
1977 ◽
Vol 14
(4)
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pp. 57-58
1974 ◽
Vol 88
(3)
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pp. 580-584
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1996 ◽
Vol 35
(3)
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pp. 209-221
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1972 ◽
Vol 119
(7)
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pp. 973
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2008 ◽
Vol 53
(2)
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pp. 105-108
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1978 ◽
Vol 39
(5)
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pp. 529-532
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