General analysis of l-out-of-2: f system exposed to cumulative damage processes

1977 ◽  
Vol 8 (2) ◽  
pp. 237-243 ◽  
Author(s):  
R. Ramanarayanan
Keyword(s):  
Cumulative Damage ◽  
General Analysis ◽  
Damage Processes ◽  
F System

Review of the Radiation Damage Problem of Organic Specimens in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 476-477
Author(s):  
L. Reimer
Keyword(s):  
Electron Microscopy ◽  
Radiation Damage ◽  
Irradiation Time ◽  
Dose Effect ◽  
Primary Process ◽  
Thin Specimen ◽  
Secondary Damage ◽  
Small Doses ◽  
Micro Organisms ◽  
Damage Processes

Most information about a specimen is obtained by elastic scattering of electrons, but one cannot avoid inelastic scattering and therefore radiation damage by ionisation as a primary process of damage. This damage is a dose effect, being proportional to the product of lectron current density j and the irradiation time t in Coul.cm−2 as long as there is a negligible heating of the specimen.Therefore one has to determine the dose needed to produce secondary damage processes, which can be measured quantitatively by a chemical or physical effect in the thin specimen. The survival of micro-organisms or the decrease of photoconductivity and cathodoluminescence are such effects needing very small doses (see table).

Cumulative damage effects of mainshock-aftershock sequences on RC-frame structures

2019 ◽  
Vol 32 (3-4) ◽  
pp. 157-169
Author(s):  
Lingxin Zhang ◽  
◽  
Baijie Zhu ◽  
Yunqin Xue ◽  
Jialu Ma ◽  
...  
Keyword(s):  
Cumulative Damage ◽  
Frame Structures ◽  
Rc Frame ◽  
Aftershock Sequences ◽  
Rc Frame Structures
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