Periodic measures of impulsive stochastic Hopfield-type lattice systems

Author(s):  
Yusen Lin ◽  
Dingshi Li
Keyword(s):  
2018 ◽  
Vol 22 (01) ◽  
pp. 1850083 ◽  
Author(s):  
Xing Liang ◽  
Tao Zhou

In this paper, we investigated spreading properties of the solutions of the Kolmogorov–Petrovsky–Piskunov–type (KPP-type) lattice system [Formula: see text] Motivated by the work in [H. Berestycki and G. Nadin, Spreading speeds for one-dimensional monostable reaction–diffusion equations, J. Math. Phys. 53(11) (2012) 115619, 23 pp.], we develop some new discrete Harnack-type estimates and homogenization techniques for the lattice system [Formula: see text] to construct two speeds [Formula: see text] such that [Formula: see text] for any [Formula: see text], and [Formula: see text] for any [Formula: see text]. These speeds are characterized by two generalized principal eigenvalues of the linearized systems of [Formula: see text]. In particular, we derive the exact spreading speed when the coefficients are random stationary ergodic or almost periodic (where [Formula: see text]). Finally, in the case where [Formula: see text] is almost periodic in [Formula: see text] and the diffusion rate [Formula: see text] is independent of [Formula: see text], we show that the spreading speeds in the positive and negative directions are identical even if [Formula: see text] is not invariant with respect to the reflection.


Author(s):  
J. C. Barry ◽  
H. Alexander

Dislocations in silicon produced by plastic deformation are generally dissociated into partials. 60° dislocations (Burgers vector type 1/2[101]) are dissociated into 30°(Burgers vector type 1/6[211]) and 90°(Burgers vector type 1/6[112]) dislocations. The 30° partials may be either of “glide” or “shuffle” type. Lattice images of the 30° dislocation have been obtained with a JEM 100B, and with a JEM 200Cx. In the aforementioned experiments a reasonable but imperfect match was obtained with calculated images for the “glide” model. In the present experiment direct structure images of 30° dislocation cores have been obtained with a JEOL 4000EX. It is possible to deduce the 30° dislocation core structure by direct inspection of the images. Dislocations were produced by compression of single crystal Si (sample preparation technique described in Alexander et al.).


1990 ◽  
Vol 41 (6) ◽  
pp. 3854-3856 ◽  
Author(s):  
Hideki Matsuoka ◽  
Hideaki Tanaka ◽  
Norio Iizuka ◽  
Takeji Hashimoto ◽  
Norio Ise

2016 ◽  
Vol 94 (3) ◽  
Author(s):  
Longyan Gong ◽  
Bingjie Xue ◽  
Wenjia Li ◽  
Weiwen Cheng ◽  
Shengmei Zhao

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