Thin Film Inspection with Millimeter-Wave Reflectometer

1995 ◽  
Vol 7 (1) ◽  
pp. 89-100
Author(s):  
H. C. Han ◽  
E. S. Mansueto
Keyword(s):  
2020 ◽  
Vol 13 (12) ◽  
pp. 124002
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Wanli Ma ◽  
Jing Wu ◽  
Zhibo Zhang ◽  
Wei Zhou ◽  
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Peter R. Smith ◽  
Lindsey J. Gray ◽  
Angel Yam ◽  
Joseph Greca ◽  
...  
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2009 ◽  
Vol 1 (1) ◽  
pp. 409-412 ◽  
Author(s):  
S. Krishnan ◽  
S. Bhansali ◽  
E. Stefanakos ◽  
Y. Goswami

2014 ◽  
Vol 497 ◽  
pp. 99-101 ◽  
Author(s):  
P. Wang ◽  
W. Xie ◽  
L. Hu ◽  
X. Liu ◽  
X.J. Zhao ◽  
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1995 ◽  
Vol 7 (2-3) ◽  
pp. 89-100 ◽  
Author(s):  
H. C. Han ◽  
E. S. Mansueto
Keyword(s):  

2015 ◽  
Vol 511 ◽  
pp. 10-14 ◽  
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X. Liu ◽  
L. Hu ◽  
W. Xie ◽  
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